USE OF ENERGY LOSS STRUCTURES IN XPS CHARACTERISATION OF SURFACES.

J. E. Castle, I. Abu-Talib, S. A. Richardson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

This paper describes advances in the use of the energy loss background associated with individual photoelectron peaks. The subtraction of a Shirley-type background is now normal practice in quantitative XPS analysis. However, in the case of a composite peak containing features from differing depths the subtraction of a common background has a clear disadvantage: i. e. the proportion of background rise associated with each component should be different but is, in fact, fixed. A peak-fitting procedure is described which enables individual backgrounds to be used for each component. The method has been tested using evaporated overlayers and this enables a mean free path for electrons undergoing small energy losses (less than 10 eV) to be determined. The use of the findings to aid in characterisation of the near surface distribution of elements and ions is described.

Original languageEnglish
Title of host publicationMaterials Research Society Symposia Proceedings
EditorsWilliam Katz, Peter Williams
Place of PublicationPittsburgh, PA, USA
PublisherMaterials Research Soc
Pages471-479
Number of pages9
Volume48
ISBN (Print)0931837138
Publication statusPublished - 1985
Externally publishedYes

Fingerprint

Energy dissipation
X ray photoelectron spectroscopy
Photoelectrons
Ions
Electrons
Composite materials

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Castle, J. E., Abu-Talib, I., & Richardson, S. A. (1985). USE OF ENERGY LOSS STRUCTURES IN XPS CHARACTERISATION OF SURFACES. In W. Katz, & P. Williams (Eds.), Materials Research Society Symposia Proceedings (Vol. 48, pp. 471-479). Pittsburgh, PA, USA: Materials Research Soc.

USE OF ENERGY LOSS STRUCTURES IN XPS CHARACTERISATION OF SURFACES. / Castle, J. E.; Abu-Talib, I.; Richardson, S. A.

Materials Research Society Symposia Proceedings. ed. / William Katz; Peter Williams. Vol. 48 Pittsburgh, PA, USA : Materials Research Soc, 1985. p. 471-479.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Castle, JE, Abu-Talib, I & Richardson, SA 1985, USE OF ENERGY LOSS STRUCTURES IN XPS CHARACTERISATION OF SURFACES. in W Katz & P Williams (eds), Materials Research Society Symposia Proceedings. vol. 48, Materials Research Soc, Pittsburgh, PA, USA, pp. 471-479.
Castle JE, Abu-Talib I, Richardson SA. USE OF ENERGY LOSS STRUCTURES IN XPS CHARACTERISATION OF SURFACES. In Katz W, Williams P, editors, Materials Research Society Symposia Proceedings. Vol. 48. Pittsburgh, PA, USA: Materials Research Soc. 1985. p. 471-479
Castle, J. E. ; Abu-Talib, I. ; Richardson, S. A. / USE OF ENERGY LOSS STRUCTURES IN XPS CHARACTERISATION OF SURFACES. Materials Research Society Symposia Proceedings. editor / William Katz ; Peter Williams. Vol. 48 Pittsburgh, PA, USA : Materials Research Soc, 1985. pp. 471-479
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