Thermal diffusivity measurement of YBa2Cu3O7-x thin film with a picosecond thermoreflectance technique

Y. Y. Kim, Hasan Adli Alwi, Q. Huang, Roslan Abd. Shukor, C. F. Tsai, H. Wang, K. W. Kim, D. G. Naugle, S. Krishnaswamy

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The thermal diffusivity of YBa2Cu3O7-x (YBCO) film was measured using the optical pump-probe method. A theoretical finite-difference model was employed to calculate the diffusivity value, and the best fit for the c-axis oriented YBCO film showed an average thermal diffusivity of 0.25 ± 0.05 mm2 s-1. The obtained result is compared to previous reports measured using various methods.

Original languageEnglish
Pages (from-to)365-368
Number of pages4
JournalPhysica C: Superconductivity and its Applications
Volume470
Issue number7-8
DOIs
Publication statusPublished - 1 Apr 2010

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Thermal diffusivity
thermal diffusivity
Thin films
thin films
diffusivity
Pumps
pumps
barium copper yttrium oxide

Keywords

  • Thermal diffusivity
  • Thermoreflectance
  • Thin films
  • YBCO

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Energy Engineering and Power Technology
  • Electronic, Optical and Magnetic Materials

Cite this

Thermal diffusivity measurement of YBa2Cu3O7-x thin film with a picosecond thermoreflectance technique. / Kim, Y. Y.; Alwi, Hasan Adli; Huang, Q.; Abd. Shukor, Roslan; Tsai, C. F.; Wang, H.; Kim, K. W.; Naugle, D. G.; Krishnaswamy, S.

In: Physica C: Superconductivity and its Applications, Vol. 470, No. 7-8, 01.04.2010, p. 365-368.

Research output: Contribution to journalArticle

Kim, Y. Y. ; Alwi, Hasan Adli ; Huang, Q. ; Abd. Shukor, Roslan ; Tsai, C. F. ; Wang, H. ; Kim, K. W. ; Naugle, D. G. ; Krishnaswamy, S. / Thermal diffusivity measurement of YBa2Cu3O7-x thin film with a picosecond thermoreflectance technique. In: Physica C: Superconductivity and its Applications. 2010 ; Vol. 470, No. 7-8. pp. 365-368.
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