The simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits

Md. Mamun Ibne Reaz; Faisal Mohd Yasin; Mohd Shahiman Sulaiman; Mohd Alauddin Ali

doi:10.1109/ISDRS.2003.1272076

The simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits

Md. Mamun Ibne Reaz, Faisal Mohd Yasin, Mohd Shahiman Sulaiman, Mohd Alauddin Ali

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents an approach to design and develop a VLSI system for the simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits. The work involves the design of an interfacing unit on PCB containing interfacing circuits for parallel data exchange between a test processor and a microcomputer. This allows IDDQ measurement for every vector used for logic testing, performing logic testing simultaneously, providing a promising IDDQ fault coverage and reducing substantially the time and cost of testing. Three basic test development strategies are considered. They are functional test development, structural test development and physical defect test development. Mixed-mode testing facility is adopted to enhance the performance and reduce the testing time.

Original language	English
Title of host publication	2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	234-235
Number of pages	2
ISBN (Print)	0780381394, 9780780381391
DOIs	https://doi.org/10.1109/ISDRS.2003.1272076
Publication status	Published - 2003
Externally published	Yes
Event	International Semiconductor Device Research Symposium, ISDRS 2003 - Washington, United States Duration: 10 Dec 2003 → 12 Dec 2003

Other

Other	International Semiconductor Device Research Symposium, ISDRS 2003
Country	United States
City	Washington
Period	10/12/03 → 12/12/03

Fingerprint

Sequential circuits

Testing

Electronic data interchange

Polychlorinated biphenyls

Microcomputers

Defects

Networks (circuits)

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Ibne Reaz, M. M., Yasin, F. M., Sulaiman, M. S., & Ali, M. A. (2003). The simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits. In 2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings (pp. 234-235). [1272076] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISDRS.2003.1272076

The simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits. / Ibne Reaz, Md. Mamun; Yasin, Faisal Mohd; Sulaiman, Mohd Shahiman; Ali, Mohd Alauddin.

2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. p. 234-235 1272076.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ibne Reaz, MM, Yasin, FM, Sulaiman, MS & Ali, MA 2003, The simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits. in 2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings., 1272076, Institute of Electrical and Electronics Engineers Inc., pp. 234-235, International Semiconductor Device Research Symposium, ISDRS 2003, Washington, United States, 10/12/03. https://doi.org/10.1109/ISDRS.2003.1272076

Ibne Reaz MM, Yasin FM, Sulaiman MS, Ali MA. The simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits. In 2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2003. p. 234-235. 1272076 https://doi.org/10.1109/ISDRS.2003.1272076

Ibne Reaz, Md. Mamun ; Yasin, Faisal Mohd ; Sulaiman, Mohd Shahiman ; Ali, Mohd Alauddin. / The simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits. 2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. pp. 234-235

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Access to Document

10.1109/ISDRS.2003.1272076