The relationship between XRD peak intensity and mechanical properties of irradiated Lead-Free solder

Wilfred Paulus, Irman Abdul Rahman, Azman Jalar @ Jalil, Norinsan Kamil Othman, Roslina Ismail, Wan Yusmawati Wan Yusoff, Maria Abu Bakar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The variation on mechanical properties and crystalline structure of gamma-irradiated Snrich lead-free solder (SAC) were intensively investigated using nanoindentation and X-ray diffraction (XRD) techniques. Samples of solder on a printed circuit board (PCB) with copper substrate were irradiated at low dose (5 Gray) of gamma from Co-60 source. The nanoindentation hardness for β-Sn phase of the solder was found to increase from 0.1935 GPa to 0.2210 GPa after the irradiation. Furthermore XRD peak intensity was also observed to increase as well indicating the occurrence of defect in β-Sn crystal structure due to gamma radiation. The defect contributes to the increment of the hardness by indicating the change in crystallite size of the grains. Microstructure analysis by FESEM-EDAX has also confirmed the indentation was performed with no cracks in subsurface on β-Sn area.

Original languageEnglish
Title of host publicationCurrent Material Research Using X-Rays and Related Techniques II
PublisherTrans Tech Publications Ltd
Pages423-427
Number of pages5
Volume888 MSF
ISBN (Print)9783035710298
DOIs
Publication statusPublished - 2017
Externally publishedYes
EventInternational Conference on X-Rays and Related Techniques in Research and Industry, ICXRI 2016 - Putrajaya, Malaysia
Duration: 17 Aug 201618 Aug 2016

Publication series

NameMaterials Science Forum
Volume888 MSF
ISSN (Print)02555476

Other

OtherInternational Conference on X-Rays and Related Techniques in Research and Industry, ICXRI 2016
CountryMalaysia
CityPutrajaya
Period17/8/1618/8/16

Fingerprint

Nanoindentation
solders
Soldering alloys
Hardness
mechanical properties
nanoindentation
X ray diffraction
Mechanical properties
Defects
hardness
Crystallite size
Indentation
diffraction
Printed circuit boards
Gamma rays
Copper
Energy dispersive spectroscopy
x rays
Crystal structure
defects

Keywords

  • Gamma
  • Nanoindentation
  • Solder
  • XRD

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Paulus, W., Abdul Rahman, I., Jalar @ Jalil, A., Othman, N. K., Ismail, R., Wan Yusoff, W. Y., & Abu Bakar, M. (2017). The relationship between XRD peak intensity and mechanical properties of irradiated Lead-Free solder. In Current Material Research Using X-Rays and Related Techniques II (Vol. 888 MSF, pp. 423-427). (Materials Science Forum; Vol. 888 MSF). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.888.423

The relationship between XRD peak intensity and mechanical properties of irradiated Lead-Free solder. / Paulus, Wilfred; Abdul Rahman, Irman; Jalar @ Jalil, Azman; Othman, Norinsan Kamil; Ismail, Roslina; Wan Yusoff, Wan Yusmawati; Abu Bakar, Maria.

Current Material Research Using X-Rays and Related Techniques II. Vol. 888 MSF Trans Tech Publications Ltd, 2017. p. 423-427 (Materials Science Forum; Vol. 888 MSF).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Paulus, W, Abdul Rahman, I, Jalar @ Jalil, A, Othman, NK, Ismail, R, Wan Yusoff, WY & Abu Bakar, M 2017, The relationship between XRD peak intensity and mechanical properties of irradiated Lead-Free solder. in Current Material Research Using X-Rays and Related Techniques II. vol. 888 MSF, Materials Science Forum, vol. 888 MSF, Trans Tech Publications Ltd, pp. 423-427, International Conference on X-Rays and Related Techniques in Research and Industry, ICXRI 2016, Putrajaya, Malaysia, 17/8/16. https://doi.org/10.4028/www.scientific.net/MSF.888.423
Paulus W, Abdul Rahman I, Jalar @ Jalil A, Othman NK, Ismail R, Wan Yusoff WY et al. The relationship between XRD peak intensity and mechanical properties of irradiated Lead-Free solder. In Current Material Research Using X-Rays and Related Techniques II. Vol. 888 MSF. Trans Tech Publications Ltd. 2017. p. 423-427. (Materials Science Forum). https://doi.org/10.4028/www.scientific.net/MSF.888.423
Paulus, Wilfred ; Abdul Rahman, Irman ; Jalar @ Jalil, Azman ; Othman, Norinsan Kamil ; Ismail, Roslina ; Wan Yusoff, Wan Yusmawati ; Abu Bakar, Maria. / The relationship between XRD peak intensity and mechanical properties of irradiated Lead-Free solder. Current Material Research Using X-Rays and Related Techniques II. Vol. 888 MSF Trans Tech Publications Ltd, 2017. pp. 423-427 (Materials Science Forum).
@inproceedings{542bb817b3b743dd8d6aa402169cde38,
title = "The relationship between XRD peak intensity and mechanical properties of irradiated Lead-Free solder",
abstract = "The variation on mechanical properties and crystalline structure of gamma-irradiated Snrich lead-free solder (SAC) were intensively investigated using nanoindentation and X-ray diffraction (XRD) techniques. Samples of solder on a printed circuit board (PCB) with copper substrate were irradiated at low dose (5 Gray) of gamma from Co-60 source. The nanoindentation hardness for β-Sn phase of the solder was found to increase from 0.1935 GPa to 0.2210 GPa after the irradiation. Furthermore XRD peak intensity was also observed to increase as well indicating the occurrence of defect in β-Sn crystal structure due to gamma radiation. The defect contributes to the increment of the hardness by indicating the change in crystallite size of the grains. Microstructure analysis by FESEM-EDAX has also confirmed the indentation was performed with no cracks in subsurface on β-Sn area.",
keywords = "Gamma, Nanoindentation, Solder, XRD",
author = "Wilfred Paulus and {Abdul Rahman}, Irman and {Jalar @ Jalil}, Azman and Othman, {Norinsan Kamil} and Roslina Ismail and {Wan Yusoff}, {Wan Yusmawati} and {Abu Bakar}, Maria",
year = "2017",
doi = "10.4028/www.scientific.net/MSF.888.423",
language = "English",
isbn = "9783035710298",
volume = "888 MSF",
series = "Materials Science Forum",
publisher = "Trans Tech Publications Ltd",
pages = "423--427",
booktitle = "Current Material Research Using X-Rays and Related Techniques II",

}

TY - GEN

T1 - The relationship between XRD peak intensity and mechanical properties of irradiated Lead-Free solder

AU - Paulus, Wilfred

AU - Abdul Rahman, Irman

AU - Jalar @ Jalil, Azman

AU - Othman, Norinsan Kamil

AU - Ismail, Roslina

AU - Wan Yusoff, Wan Yusmawati

AU - Abu Bakar, Maria

PY - 2017

Y1 - 2017

N2 - The variation on mechanical properties and crystalline structure of gamma-irradiated Snrich lead-free solder (SAC) were intensively investigated using nanoindentation and X-ray diffraction (XRD) techniques. Samples of solder on a printed circuit board (PCB) with copper substrate were irradiated at low dose (5 Gray) of gamma from Co-60 source. The nanoindentation hardness for β-Sn phase of the solder was found to increase from 0.1935 GPa to 0.2210 GPa after the irradiation. Furthermore XRD peak intensity was also observed to increase as well indicating the occurrence of defect in β-Sn crystal structure due to gamma radiation. The defect contributes to the increment of the hardness by indicating the change in crystallite size of the grains. Microstructure analysis by FESEM-EDAX has also confirmed the indentation was performed with no cracks in subsurface on β-Sn area.

AB - The variation on mechanical properties and crystalline structure of gamma-irradiated Snrich lead-free solder (SAC) were intensively investigated using nanoindentation and X-ray diffraction (XRD) techniques. Samples of solder on a printed circuit board (PCB) with copper substrate were irradiated at low dose (5 Gray) of gamma from Co-60 source. The nanoindentation hardness for β-Sn phase of the solder was found to increase from 0.1935 GPa to 0.2210 GPa after the irradiation. Furthermore XRD peak intensity was also observed to increase as well indicating the occurrence of defect in β-Sn crystal structure due to gamma radiation. The defect contributes to the increment of the hardness by indicating the change in crystallite size of the grains. Microstructure analysis by FESEM-EDAX has also confirmed the indentation was performed with no cracks in subsurface on β-Sn area.

KW - Gamma

KW - Nanoindentation

KW - Solder

KW - XRD

UR - http://www.scopus.com/inward/record.url?scp=85014966704&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85014966704&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/MSF.888.423

DO - 10.4028/www.scientific.net/MSF.888.423

M3 - Conference contribution

SN - 9783035710298

VL - 888 MSF

T3 - Materials Science Forum

SP - 423

EP - 427

BT - Current Material Research Using X-Rays and Related Techniques II

PB - Trans Tech Publications Ltd

ER -