The measurement of refractive index and thickness of planar waveguide using couple mode theory method - the programming highlight

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The prism coupler, known from experiments on integrated optics, can be used to determine the refractive index and thickness of a light-guiding thin film. Both parameters are obtained simultaneously and with high accuracy by measuring the coupling angles at the prism and fitting them by a theoretical dispersion curve. In this paper, the fundamentals and limitations of this method are discussed, its practical use, and mathematical procedures for evaluation. To perform accurate and fast calculation, a program based on MATLAB is developed to measure the thickness and refractive index of the planar waveguide. Once such parameter set up is completed, the program will perform the simulation and its output will contain the specification of the waveguide layer and the reading accuracy. Our measurement set up and calculation program ensured effective cost and time consumption with the high accuracy capability in data acquisition.

Original languageEnglish
Pages (from-to)2901-2907
Number of pages7
JournalAustralian Journal of Basic and Applied Sciences
Volume3
Issue number3
Publication statusPublished - Jul 2009

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programming
refractivity
waveguides
prisms
integrated optics
couplers
data acquisition
specifications
costs
evaluation
output
curves
thin films
simulation

Keywords

  • Analysis program
  • Prism coupling
  • Refractive index
  • Thickness

ASJC Scopus subject areas

  • General

Cite this

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abstract = "The prism coupler, known from experiments on integrated optics, can be used to determine the refractive index and thickness of a light-guiding thin film. Both parameters are obtained simultaneously and with high accuracy by measuring the coupling angles at the prism and fitting them by a theoretical dispersion curve. In this paper, the fundamentals and limitations of this method are discussed, its practical use, and mathematical procedures for evaluation. To perform accurate and fast calculation, a program based on MATLAB is developed to measure the thickness and refractive index of the planar waveguide. Once such parameter set up is completed, the program will perform the simulation and its output will contain the specification of the waveguide layer and the reading accuracy. Our measurement set up and calculation program ensured effective cost and time consumption with the high accuracy capability in data acquisition.",
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AB - The prism coupler, known from experiments on integrated optics, can be used to determine the refractive index and thickness of a light-guiding thin film. Both parameters are obtained simultaneously and with high accuracy by measuring the coupling angles at the prism and fitting them by a theoretical dispersion curve. In this paper, the fundamentals and limitations of this method are discussed, its practical use, and mathematical procedures for evaluation. To perform accurate and fast calculation, a program based on MATLAB is developed to measure the thickness and refractive index of the planar waveguide. Once such parameter set up is completed, the program will perform the simulation and its output will contain the specification of the waveguide layer and the reading accuracy. Our measurement set up and calculation program ensured effective cost and time consumption with the high accuracy capability in data acquisition.

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