Test pattern optimization using proper seed selection in mixed-mode technique

Syed Zahidul Islam, Mohd Alauddin Mohd Ali

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)

    Abstract

    This paper presents a test pattern optimization approach using a proper number of seed selection in mixed-mode patterns. In mixed-mode patterns, the test set is assembled from LFSR based pseudorandom and deterministic patterns. The efficiency of this approach is largely determined by the ratio of those test patterns in the final test. The experiment results show that the total number of patterns in this optimized mixed-mode is minimized compared to conventional mixed-mode technique.

    Original languageEnglish
    Title of host publicationProceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006
    Pages105-109
    Number of pages5
    Volume2006
    DOIs
    Publication statusPublished - 2006
    EventThird IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006 - Kuala Lumpur
    Duration: 17 Jan 200619 Jan 2006

    Other

    OtherThird IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006
    CityKuala Lumpur
    Period17/1/0619/1/06

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    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Islam, S. Z., & Ali, M. A. M. (2006). Test pattern optimization using proper seed selection in mixed-mode technique. In Proceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006 (Vol. 2006, pp. 105-109). [1581197] https://doi.org/10.1109/DELTA.2006.86

    Test pattern optimization using proper seed selection in mixed-mode technique. / Islam, Syed Zahidul; Ali, Mohd Alauddin Mohd.

    Proceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006. Vol. 2006 2006. p. 105-109 1581197.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Islam, SZ & Ali, MAM 2006, Test pattern optimization using proper seed selection in mixed-mode technique. in Proceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006. vol. 2006, 1581197, pp. 105-109, Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006, Kuala Lumpur, 17/1/06. https://doi.org/10.1109/DELTA.2006.86
    Islam SZ, Ali MAM. Test pattern optimization using proper seed selection in mixed-mode technique. In Proceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006. Vol. 2006. 2006. p. 105-109. 1581197 https://doi.org/10.1109/DELTA.2006.86
    Islam, Syed Zahidul ; Ali, Mohd Alauddin Mohd. / Test pattern optimization using proper seed selection in mixed-mode technique. Proceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006. Vol. 2006 2006. pp. 105-109
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