Abstract
ZnO thin films have been successfully synthesized by thermal evaporation of pure zinc at 900 °C under the flow of different percentages of argon and oxygen gases. The films were characterized by X-ray diffraction (XRD), variable pressure scanning electron microscopy (VPSEM), energy dispersive X-ray spectroscopy (EDS) and UV-vis spectroscopy. The aim of this paper is to study the influence of the oxygen percentage on the structural and morphological properties of the ZnO films. VPSEM results show that very thick needle structures were produced at high oxygen percentages. EDS results revealed that only Zn and O are present in the sample, indicating a composition of pure ZnO. XRD results showed that the ZnO synthesized under different quantities of oxygen were crystalline with the hexagonal wurtzite structure. UV-vis spectroscopy results indicated that the optical band gap energies from the transmission spectrum are between 3.62 and 3.69 eV for ZnO thin films.
| Original language | English |
|---|---|
| Pages (from-to) | 1501-1504 |
| Number of pages | 4 |
| Journal | Journal of Physics and Chemistry of Solids |
| Volume | 70 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - Dec 2009 |
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Keywords
- A. Thin films
- C. Electron microscopy
- D. Microstructure
ASJC Scopus subject areas
- Condensed Matter Physics
- Chemistry(all)
- Materials Science(all)
Cite this
Synthesis and characterization of ZnO thin films by thermal evaporation. / Fatimah Hasim, Siti Nuurul; Abdul Hamid, Muhammad Azmi; Shamsudin, Roslinda; Jalar @ Jalil, Azman.
In: Journal of Physics and Chemistry of Solids, Vol. 70, No. 12, 12.2009, p. 1501-1504.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Synthesis and characterization of ZnO thin films by thermal evaporation
AU - Fatimah Hasim, Siti Nuurul
AU - Abdul Hamid, Muhammad Azmi
AU - Shamsudin, Roslinda
AU - Jalar @ Jalil, Azman
PY - 2009/12
Y1 - 2009/12
N2 - ZnO thin films have been successfully synthesized by thermal evaporation of pure zinc at 900 °C under the flow of different percentages of argon and oxygen gases. The films were characterized by X-ray diffraction (XRD), variable pressure scanning electron microscopy (VPSEM), energy dispersive X-ray spectroscopy (EDS) and UV-vis spectroscopy. The aim of this paper is to study the influence of the oxygen percentage on the structural and morphological properties of the ZnO films. VPSEM results show that very thick needle structures were produced at high oxygen percentages. EDS results revealed that only Zn and O are present in the sample, indicating a composition of pure ZnO. XRD results showed that the ZnO synthesized under different quantities of oxygen were crystalline with the hexagonal wurtzite structure. UV-vis spectroscopy results indicated that the optical band gap energies from the transmission spectrum are between 3.62 and 3.69 eV for ZnO thin films.
AB - ZnO thin films have been successfully synthesized by thermal evaporation of pure zinc at 900 °C under the flow of different percentages of argon and oxygen gases. The films were characterized by X-ray diffraction (XRD), variable pressure scanning electron microscopy (VPSEM), energy dispersive X-ray spectroscopy (EDS) and UV-vis spectroscopy. The aim of this paper is to study the influence of the oxygen percentage on the structural and morphological properties of the ZnO films. VPSEM results show that very thick needle structures were produced at high oxygen percentages. EDS results revealed that only Zn and O are present in the sample, indicating a composition of pure ZnO. XRD results showed that the ZnO synthesized under different quantities of oxygen were crystalline with the hexagonal wurtzite structure. UV-vis spectroscopy results indicated that the optical band gap energies from the transmission spectrum are between 3.62 and 3.69 eV for ZnO thin films.
KW - A. Thin films
KW - C. Electron microscopy
KW - D. Microstructure
UR - http://www.scopus.com/inward/record.url?scp=70350572882&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=70350572882&partnerID=8YFLogxK
U2 - 10.1016/j.jpcs.2009.09.013
DO - 10.1016/j.jpcs.2009.09.013
M3 - Article
AN - SCOPUS:70350572882
VL - 70
SP - 1501
EP - 1504
JO - Journal of Physics and Chemistry of Solids
JF - Journal of Physics and Chemistry of Solids
SN - 0022-3697
IS - 12
ER -