Surface roughness of thermally evaporated ZnS optical waveguides

Saafie Salleh, Abdullah Chik, M. N. Dalimin, Muhamad Mat Salleh, H. N. Rutt

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this study, the propagation loss and the surfaces of ZnS thin films on silicon substrates have been investigated. ZnS thin films have been prepared by thermal evaporation at two different substrate temperatures, which were at ambient temperature and at - 50°C. The propagation losses were measured with scanning detection technique attached to a Prism Coupling and the thin film surfaces were characterized with an Atomic Force Microscope. The waveguide propagation loss of ambient deposited film is 131.50 dB/cm whereas the loss of cold deposited film is 20.41 dB/cm. The surface roughness of the waveguide is enhanced for cold evaporated ZnS film.

Original languageEnglish
Title of host publication2005 Asian Conference on Sensors and the International Conference on New Techniques in Pharmaceutical and Biomedical Research - Proceedings
Pages229-232
Number of pages4
Volume2005
DOIs
Publication statusPublished - 2005
Event2005 Asian Conference on Sensors and the International Conference on new Techniques in Pharmaceutical and Biomedical Research - Kuala Lumpur
Duration: 5 Sep 20057 Sep 2005

Other

Other2005 Asian Conference on Sensors and the International Conference on new Techniques in Pharmaceutical and Biomedical Research
CityKuala Lumpur
Period5/9/057/9/05

Fingerprint

Optical waveguides
Surface roughness
Thin films
Waveguides
Thermal evaporation
Substrates
Prisms
Microscopes
Scanning
Silicon
Temperature

Keywords

  • Cold deposition
  • Propagation loss
  • Surface roughness
  • ZnS thin film

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Salleh, S., Chik, A., Dalimin, M. N., Mat Salleh, M., & Rutt, H. N. (2005). Surface roughness of thermally evaporated ZnS optical waveguides. In 2005 Asian Conference on Sensors and the International Conference on New Techniques in Pharmaceutical and Biomedical Research - Proceedings (Vol. 2005, pp. 229-232). [1564546] https://doi.org/10.1109/ASENSE.2005.1564546

Surface roughness of thermally evaporated ZnS optical waveguides. / Salleh, Saafie; Chik, Abdullah; Dalimin, M. N.; Mat Salleh, Muhamad; Rutt, H. N.

2005 Asian Conference on Sensors and the International Conference on New Techniques in Pharmaceutical and Biomedical Research - Proceedings. Vol. 2005 2005. p. 229-232 1564546.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Salleh, S, Chik, A, Dalimin, MN, Mat Salleh, M & Rutt, HN 2005, Surface roughness of thermally evaporated ZnS optical waveguides. in 2005 Asian Conference on Sensors and the International Conference on New Techniques in Pharmaceutical and Biomedical Research - Proceedings. vol. 2005, 1564546, pp. 229-232, 2005 Asian Conference on Sensors and the International Conference on new Techniques in Pharmaceutical and Biomedical Research, Kuala Lumpur, 5/9/05. https://doi.org/10.1109/ASENSE.2005.1564546
Salleh S, Chik A, Dalimin MN, Mat Salleh M, Rutt HN. Surface roughness of thermally evaporated ZnS optical waveguides. In 2005 Asian Conference on Sensors and the International Conference on New Techniques in Pharmaceutical and Biomedical Research - Proceedings. Vol. 2005. 2005. p. 229-232. 1564546 https://doi.org/10.1109/ASENSE.2005.1564546
Salleh, Saafie ; Chik, Abdullah ; Dalimin, M. N. ; Mat Salleh, Muhamad ; Rutt, H. N. / Surface roughness of thermally evaporated ZnS optical waveguides. 2005 Asian Conference on Sensors and the International Conference on New Techniques in Pharmaceutical and Biomedical Research - Proceedings. Vol. 2005 2005. pp. 229-232
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