Surface defect characterization in polishing process using contour dispersion

Adnan Rachmat Anom Besari, Ruzaidi Zamri, Khairul Anuar A Rahman, Dan Palil, Anton Satria Prabuwono

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)

    Abstract

    Automatic surface defect detection with vision systems can bring manufacturers a number of significant benefits, especially when used on-line. This non-contact method may present an alternative to allow the surface defect to be measured rapidly and with an acceptable accuracy. One of the most promising of the non-contact methods in terms of speed and accuracy is the computer vision technique. This paper basically defines a surface defect characterization using contour dispersion. The basic idea of this research is to find an optimal gray-level threshold value for separating objects of interest in an image from the background based on their graylevel distribution using contour dispersion level to find the characteristic of surface defect. Next, the research direction has been suggested to develop an automatic polishing robot system using vision sensor based on surface defect characterization.

    Original languageEnglish
    Title of host publicationSoCPaR 2009 - Soft Computing and Pattern Recognition
    Pages707-710
    Number of pages4
    DOIs
    Publication statusPublished - 2009
    EventInternational Conference on Soft Computing and Pattern Recognition, SoCPaR 2009 - Malacca
    Duration: 4 Dec 20097 Dec 2009

    Other

    OtherInternational Conference on Soft Computing and Pattern Recognition, SoCPaR 2009
    CityMalacca
    Period4/12/097/12/09

    Fingerprint

    Surface defects
    Polishing
    Computer vision
    Robots
    Sensors

    Keywords

    • Contour dispersion
    • Multilevel thresholding
    • Polishing process
    • Scratch and corrosion
    • Surface defect characterization

    ASJC Scopus subject areas

    • Computational Theory and Mathematics
    • Computer Vision and Pattern Recognition
    • Software

    Cite this

    Besari, A. R. A., Zamri, R., Rahman, K. A. A., Palil, D., & Prabuwono, A. S. (2009). Surface defect characterization in polishing process using contour dispersion. In SoCPaR 2009 - Soft Computing and Pattern Recognition (pp. 707-710). [5370962] https://doi.org/10.1109/SoCPaR.2009.142

    Surface defect characterization in polishing process using contour dispersion. / Besari, Adnan Rachmat Anom; Zamri, Ruzaidi; Rahman, Khairul Anuar A; Palil, Dan; Prabuwono, Anton Satria.

    SoCPaR 2009 - Soft Computing and Pattern Recognition. 2009. p. 707-710 5370962.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Besari, ARA, Zamri, R, Rahman, KAA, Palil, D & Prabuwono, AS 2009, Surface defect characterization in polishing process using contour dispersion. in SoCPaR 2009 - Soft Computing and Pattern Recognition., 5370962, pp. 707-710, International Conference on Soft Computing and Pattern Recognition, SoCPaR 2009, Malacca, 4/12/09. https://doi.org/10.1109/SoCPaR.2009.142
    Besari ARA, Zamri R, Rahman KAA, Palil D, Prabuwono AS. Surface defect characterization in polishing process using contour dispersion. In SoCPaR 2009 - Soft Computing and Pattern Recognition. 2009. p. 707-710. 5370962 https://doi.org/10.1109/SoCPaR.2009.142
    Besari, Adnan Rachmat Anom ; Zamri, Ruzaidi ; Rahman, Khairul Anuar A ; Palil, Dan ; Prabuwono, Anton Satria. / Surface defect characterization in polishing process using contour dispersion. SoCPaR 2009 - Soft Computing and Pattern Recognition. 2009. pp. 707-710
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