Study of X-ray diffraction patterns in Langmuir-Blodgett films using the few-slits model of diffraction

A. S. Belal, Muhamad Mat Salleh, Muhammad Yahaya

Research output: Contribution to journalArticle

Abstract

Multilayer films of cadmium 22-tricosenoiate were deposited by using the Langmuir-Blodgett technique in the Z-mode of deposition. The films were then irradiated with various γ-irradiation doses. Small-angle X-ray diffraction patterns of the films before and after γ-irradiation were studied by applying the model of diffraction by a few slits. The X-ray diffraction patterns of the films before γ-irradiation show nine equidistant peaks, indicating the presence of a regular periodic structure in the film. The intensities of the even-order diffraction peaks are relatively less than those from the neighbouring odd-order peaks. This phenomenon, known as even-odd intensity oscillation, was successfully explained by this model. The position of the X-ray diffraction peaks taken for films after different γ-irradiation doses does not change, indicating that the average spacing in the film is unaffected by γ-irradiation. However, the intensity of the diffraction peaks of the film does change with γ-irradiation dose. This change can be explained by the change of electron density along the molecular chain in the layer before and after various γ-irradiation doses.

Original languageEnglish
Pages (from-to)535-538
Number of pages4
JournalSupramolecular Science
Volume4
Issue number3-4
DOIs
Publication statusPublished - Sep 1997

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Langmuir Blodgett films
Diffraction patterns
Diffraction
Irradiation
X ray diffraction
Dosimetry
Periodic structures
Multilayer films
Cadmium
Carrier concentration

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Study of X-ray diffraction patterns in Langmuir-Blodgett films using the few-slits model of diffraction. / Belal, A. S.; Mat Salleh, Muhamad; Yahaya, Muhammad.

In: Supramolecular Science, Vol. 4, No. 3-4, 09.1997, p. 535-538.

Research output: Contribution to journalArticle

Belal, A. S. ; Mat Salleh, Muhamad ; Yahaya, Muhammad. / Study of X-ray diffraction patterns in Langmuir-Blodgett films using the few-slits model of diffraction. In: Supramolecular Science. 1997 ; Vol. 4, No. 3-4. pp. 535-538.
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