Structural electrical and optical properties of Zn rich CZTS thin film

M. A. Islam, Aiman Aziz, Gunawan Witjaksono, Nowshad Amin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Cu2ZnSnS4 (CZTS) thin films have been deposited by co-sputtering technique from a CZTS and ZnS target on top of glass substrate aiming to increase the Zn content on the CZTS thin films. The prepared sample was annealed at 500 °C in a high vacuum (50mTorr) ambient for 20 min. of duration. Structural, compositional, and electrical properties of the prepared films were carried out in this study. The change in the microstructure with subsequent recrystallization and grain growth was observed in annealed thin film. The peak intensity as well as crystallite grain size was observed to increase by the effect of annealing, whereas the dislocation densities and microstrain of the films are reduced as observed in XRD analysis. The films are found in Zn rich kesterite structure with a good stoichiometry. The annealing process increases the film resistivity from 17.78 Ω-cm to 192.60 Ω-cm corresponding to the as-deposited and annealed CZTS thin films. The bandgap of the films are observed to decrease by the effect of annealing process.

Original languageEnglish
Title of host publicationProceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages90-93
Number of pages4
ISBN (Print)9781479926565
DOIs
Publication statusPublished - 6 Jan 2015
Event2013 11th IEEE Student Conference on Research and Development, SCOReD 2013 - Putrajaya
Duration: 16 Dec 201317 Dec 2013

Other

Other2013 11th IEEE Student Conference on Research and Development, SCOReD 2013
CityPutrajaya
Period16/12/1317/12/13

Fingerprint

Electric properties
Optical properties
Thin films
Annealing
Grain growth
Stoichiometry
Sputtering
Structural properties
Energy gap
Vacuum
Glass
Microstructure
Substrates

Keywords

  • co-sputtering
  • CZTS thin film
  • XRD
  • Zn-rich

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Biomedical Engineering
  • Electrical and Electronic Engineering

Cite this

Islam, M. A., Aziz, A., Witjaksono, G., & Amin, N. (2015). Structural electrical and optical properties of Zn rich CZTS thin film. In Proceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013 (pp. 90-93). [7002549] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SCOReD.2013.7002549

Structural electrical and optical properties of Zn rich CZTS thin film. / Islam, M. A.; Aziz, Aiman; Witjaksono, Gunawan; Amin, Nowshad.

Proceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013. Institute of Electrical and Electronics Engineers Inc., 2015. p. 90-93 7002549.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Islam, MA, Aziz, A, Witjaksono, G & Amin, N 2015, Structural electrical and optical properties of Zn rich CZTS thin film. in Proceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013., 7002549, Institute of Electrical and Electronics Engineers Inc., pp. 90-93, 2013 11th IEEE Student Conference on Research and Development, SCOReD 2013, Putrajaya, 16/12/13. https://doi.org/10.1109/SCOReD.2013.7002549
Islam MA, Aziz A, Witjaksono G, Amin N. Structural electrical and optical properties of Zn rich CZTS thin film. In Proceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013. Institute of Electrical and Electronics Engineers Inc. 2015. p. 90-93. 7002549 https://doi.org/10.1109/SCOReD.2013.7002549
Islam, M. A. ; Aziz, Aiman ; Witjaksono, Gunawan ; Amin, Nowshad. / Structural electrical and optical properties of Zn rich CZTS thin film. Proceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 90-93
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