Structural and morphology of zinc sulphide thin films on various temperature

A. H Afifah Maheran, Huda Abdullah, Muzalifah Said, M. N Zul Atfyi Fauzan, Nor Zaidi Haron

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This study were focused on nanocrystalline structure and morphology on zinc sulphide thin film in four different temperature which are at 250°C, 300°C, 350°C and 400°C. Sol-gel technique is used to produce the thin films on quartz slide. The reaction of chemical obtained was a colloidal and transparent solution. There are EDX, SEM and XRD experiment were used to characterize the sample in each thin film. EDX analysis confirmed that the thin film consist of element zinc and sulphur. In SEM shows the film are thicker and have bigger grains size when the film annealed at 400°C compared to temperature of 250°C with the grain size between 26.8-60.3 nm and 22.3-29.0 nm respectively. The thicknesses of the film are 93.79 nm, 107.2 nm, 119.1 nm and 127.3 nm from temperature of 250°C to 400°C respectively. XRD shows development of well-crystallized film with pure wurtzite structure after annealing. XRD spectrum indicates that the films are amorphous and have cubic zinc blend structure.

Original languageEnglish
Title of host publication2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts
Pages28-31
Number of pages4
DOIs
Publication statusPublished - 2011
Event2011 IEEE Regional Symposium on Micro and Nano Electronics, RSM 2011 - Kota Kinabalu, Sabah
Duration: 28 Sep 201130 Sep 2011

Other

Other2011 IEEE Regional Symposium on Micro and Nano Electronics, RSM 2011
CityKota Kinabalu, Sabah
Period28/9/1130/9/11

Fingerprint

Zinc sulfide
Thin films
Energy dispersive spectroscopy
Zinc
Temperature
Scanning electron microscopy
Amorphous films
Thick films
Chemical elements
Sol-gels
Quartz
Sulfur
Annealing
Experiments

Keywords

  • annealing
  • nanocrystalline
  • Sol-gel method
  • Zinc Sulphide thin film

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Maheran, A. H. A., Abdullah, H., Said, M., Fauzan, M. N. Z. A., & Haron, N. Z. (2011). Structural and morphology of zinc sulphide thin films on various temperature. In 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts (pp. 28-31). [6088284] https://doi.org/10.1109/RSM.2011.6088284

Structural and morphology of zinc sulphide thin films on various temperature. / Maheran, A. H Afifah; Abdullah, Huda; Said, Muzalifah; Fauzan, M. N Zul Atfyi; Haron, Nor Zaidi.

2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. 2011. p. 28-31 6088284.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Maheran, AHA, Abdullah, H, Said, M, Fauzan, MNZA & Haron, NZ 2011, Structural and morphology of zinc sulphide thin films on various temperature. in 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts., 6088284, pp. 28-31, 2011 IEEE Regional Symposium on Micro and Nano Electronics, RSM 2011, Kota Kinabalu, Sabah, 28/9/11. https://doi.org/10.1109/RSM.2011.6088284
Maheran AHA, Abdullah H, Said M, Fauzan MNZA, Haron NZ. Structural and morphology of zinc sulphide thin films on various temperature. In 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. 2011. p. 28-31. 6088284 https://doi.org/10.1109/RSM.2011.6088284
Maheran, A. H Afifah ; Abdullah, Huda ; Said, Muzalifah ; Fauzan, M. N Zul Atfyi ; Haron, Nor Zaidi. / Structural and morphology of zinc sulphide thin films on various temperature. 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. 2011. pp. 28-31
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