Properties of sputtered ZnS thin films for photovoltaic application

Faiazul Haque, Kazi Sajedur Rahman, Md. Akhtaruzzaman, Huda Abdullah, Tiong Sieh Kiong, Nowshad Amin

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.

Original languageEnglish
Article number096409
JournalMaterials Research Express
Volume5
Issue number9
DOIs
Publication statusPublished - 1 Sep 2018

Fingerprint

Thin films
Optical properties
Hall effect
Surface topography
Lime
Magnetron sputtering
Spectrometry
Surface morphology
Zinc
Electric properties
Energy gap
Photons
Surface roughness
Glass
Wavelength
Substrates
soda lime

Keywords

  • optical bandgap
  • sputtering
  • XRD
  • ZnS thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Polymers and Plastics
  • Metals and Alloys

Cite this

Properties of sputtered ZnS thin films for photovoltaic application. / Haque, Faiazul; Rahman, Kazi Sajedur; Akhtaruzzaman, Md.; Abdullah, Huda; Kiong, Tiong Sieh; Amin, Nowshad.

In: Materials Research Express, Vol. 5, No. 9, 096409, 01.09.2018.

Research output: Contribution to journalArticle

Haque, Faiazul ; Rahman, Kazi Sajedur ; Akhtaruzzaman, Md. ; Abdullah, Huda ; Kiong, Tiong Sieh ; Amin, Nowshad. / Properties of sputtered ZnS thin films for photovoltaic application. In: Materials Research Express. 2018 ; Vol. 5, No. 9.
@article{5f9ba21fc2bf49c49018084e5e48fc52,
title = "Properties of sputtered ZnS thin films for photovoltaic application",
abstract = "ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.",
keywords = "optical bandgap, sputtering, XRD, ZnS thin films",
author = "Faiazul Haque and Rahman, {Kazi Sajedur} and Md. Akhtaruzzaman and Huda Abdullah and Kiong, {Tiong Sieh} and Nowshad Amin",
year = "2018",
month = "9",
day = "1",
doi = "10.1088/2053-1591/aad6c6",
language = "English",
volume = "5",
journal = "Materials Research Express",
issn = "2053-1591",
publisher = "IOP Publishing Ltd.",
number = "9",

}

TY - JOUR

T1 - Properties of sputtered ZnS thin films for photovoltaic application

AU - Haque, Faiazul

AU - Rahman, Kazi Sajedur

AU - Akhtaruzzaman, Md.

AU - Abdullah, Huda

AU - Kiong, Tiong Sieh

AU - Amin, Nowshad

PY - 2018/9/1

Y1 - 2018/9/1

N2 - ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.

AB - ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.

KW - optical bandgap

KW - sputtering

KW - XRD

KW - ZnS thin films

UR - http://www.scopus.com/inward/record.url?scp=85052313385&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85052313385&partnerID=8YFLogxK

U2 - 10.1088/2053-1591/aad6c6

DO - 10.1088/2053-1591/aad6c6

M3 - Article

AN - SCOPUS:85052313385

VL - 5

JO - Materials Research Express

JF - Materials Research Express

SN - 2053-1591

IS - 9

M1 - 096409

ER -