Propagation of surface plasmon waves at metal thin film/air interface using modified optical waveguiding assembly

Wan Maisarah Mukhtar, Sahbudin Shaari, P. Susthitha Menon N V Visvanathan

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Surface Plasmon Resonance (SPR) spectroscopy is a surface-sensitive technique that has been extensively studied in sensing applications. For the optimization purpose of data collection, the SPR setup becomes more costly due to the employment of expensive optical apparatus. In this study, we proposed a modified optical waveguiding assembly to observe the plasmon mode coupling phenomenon. By employing the Kretschmann configuration, the effect of various thicknesses of silver thin films to the strength of SPR signal was investigated. The experimental results show an excellent agreement with the Fresnel equation from simulated results which verify the stability and the accuracy of our setup to observe the SPR phenomena. The optimum thickness of thin film for the excitation of strong SPR signal is 50 nm which results in minimum reflectance of 0.136 at a resonant angle of 56°. As the thicknesses increased to 70 nm and 90 nm, the SPR dip became shallower considering the absorption of surface plasmon polaritons in a silver layer. A good verification between both experimental and simulated results with small percentage difference of 0.90% proves the capability of our proposed modified optical waveguiding setup to be used in SPR experiments.

Original languageEnglish
Pages (from-to)9-13
Number of pages5
JournalOptoelectronics and Advanced Materials, Rapid Communications
Volume7
Issue number1-2
Publication statusPublished - 2013

Fingerprint

Surface plasmon resonance
Metals
Thin films
Air
Silver
Spectroscopy

Keywords

  • Low cost
  • Optical waveguiding
  • Silver
  • Surface plasmon resonance
  • Thin film thickness

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

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abstract = "Surface Plasmon Resonance (SPR) spectroscopy is a surface-sensitive technique that has been extensively studied in sensing applications. For the optimization purpose of data collection, the SPR setup becomes more costly due to the employment of expensive optical apparatus. In this study, we proposed a modified optical waveguiding assembly to observe the plasmon mode coupling phenomenon. By employing the Kretschmann configuration, the effect of various thicknesses of silver thin films to the strength of SPR signal was investigated. The experimental results show an excellent agreement with the Fresnel equation from simulated results which verify the stability and the accuracy of our setup to observe the SPR phenomena. The optimum thickness of thin film for the excitation of strong SPR signal is 50 nm which results in minimum reflectance of 0.136 at a resonant angle of 56°. As the thicknesses increased to 70 nm and 90 nm, the SPR dip became shallower considering the absorption of surface plasmon polaritons in a silver layer. A good verification between both experimental and simulated results with small percentage difference of 0.90{\%} proves the capability of our proposed modified optical waveguiding setup to be used in SPR experiments.",
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N2 - Surface Plasmon Resonance (SPR) spectroscopy is a surface-sensitive technique that has been extensively studied in sensing applications. For the optimization purpose of data collection, the SPR setup becomes more costly due to the employment of expensive optical apparatus. In this study, we proposed a modified optical waveguiding assembly to observe the plasmon mode coupling phenomenon. By employing the Kretschmann configuration, the effect of various thicknesses of silver thin films to the strength of SPR signal was investigated. The experimental results show an excellent agreement with the Fresnel equation from simulated results which verify the stability and the accuracy of our setup to observe the SPR phenomena. The optimum thickness of thin film for the excitation of strong SPR signal is 50 nm which results in minimum reflectance of 0.136 at a resonant angle of 56°. As the thicknesses increased to 70 nm and 90 nm, the SPR dip became shallower considering the absorption of surface plasmon polaritons in a silver layer. A good verification between both experimental and simulated results with small percentage difference of 0.90% proves the capability of our proposed modified optical waveguiding setup to be used in SPR experiments.

AB - Surface Plasmon Resonance (SPR) spectroscopy is a surface-sensitive technique that has been extensively studied in sensing applications. For the optimization purpose of data collection, the SPR setup becomes more costly due to the employment of expensive optical apparatus. In this study, we proposed a modified optical waveguiding assembly to observe the plasmon mode coupling phenomenon. By employing the Kretschmann configuration, the effect of various thicknesses of silver thin films to the strength of SPR signal was investigated. The experimental results show an excellent agreement with the Fresnel equation from simulated results which verify the stability and the accuracy of our setup to observe the SPR phenomena. The optimum thickness of thin film for the excitation of strong SPR signal is 50 nm which results in minimum reflectance of 0.136 at a resonant angle of 56°. As the thicknesses increased to 70 nm and 90 nm, the SPR dip became shallower considering the absorption of surface plasmon polaritons in a silver layer. A good verification between both experimental and simulated results with small percentage difference of 0.90% proves the capability of our proposed modified optical waveguiding setup to be used in SPR experiments.

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