Postdeposition annealing effect on CunSnSthin films grown at different substrate temperature

Samia Ahmed Nadi, Puvaneswaran Chelvanathan, Zaihasraf Zakaria, Mohammad Mezbaul Alam, Zeid A. Alothman, Kamaruzzaman Sopian, Nowshad Amin

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

CunSnS(CZTS) thin films were deposited on top of Molybdenum (Mo) coated soda lime glass (SLG) substrates using a single target rf magnetron sputtering technique. The sputtering parameters such as base pressure, working pressure, rf power, argon (Ar) gas flow rate, and deposition time were kept consistent throughout the experiment. The effect of different substrate temperatures, for example, room temperature (RT), 300°C, 350°C, 370°C, 400°C, and 450°C, was analyzed by studying their structural, electrical, and optical properties. As-sputtered films were then annealed at 460°C. X-ray diffraction (XRD) measurement revealed the structure to be kesterite with peak of (112) plane in both annealed and as-sputtered CZTS thin films. The crystallinity of the films improved with the increasing substrate temperature until 370°C. Secondary phases of MoS Cu x MoS x, Cu x SnS x, Cu x S, and CuoSnS(hemusite) were also observed in the annealed CZTS films. Scanning electron microscopy (SEM) shows crystallite size of deposited CZTS thin film to be proportionally related to deposition temperature. The highest surface roughness of 67.318 nm is observed by atomic force microscopy (AFM). The conductivity type of the films was found to be p-type by Hall effect measurement system.

Original languageEnglish
Article number589027
JournalInternational Journal of Photoenergy
Volume2014
DOIs
Publication statusPublished - 2014

Fingerprint

Annealing
annealing
Substrates
Thin films
thin films
base pressure
Temperature
Molybdenum
temperature
Argon
Hall effect
calcium oxides
Crystallite size
Lime
Magnetron sputtering
molybdenum
gas flow
Sputtering
Flow of gases
Structural properties

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Chemistry(all)
  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)

Cite this

Postdeposition annealing effect on CunSnSthin films grown at different substrate temperature. / Nadi, Samia Ahmed; Chelvanathan, Puvaneswaran; Zakaria, Zaihasraf; Alam, Mohammad Mezbaul; Alothman, Zeid A.; Sopian, Kamaruzzaman; Amin, Nowshad.

In: International Journal of Photoenergy, Vol. 2014, 589027, 2014.

Research output: Contribution to journalArticle

Nadi, Samia Ahmed ; Chelvanathan, Puvaneswaran ; Zakaria, Zaihasraf ; Alam, Mohammad Mezbaul ; Alothman, Zeid A. ; Sopian, Kamaruzzaman ; Amin, Nowshad. / Postdeposition annealing effect on CunSnSthin films grown at different substrate temperature. In: International Journal of Photoenergy. 2014 ; Vol. 2014.
@article{13a4085fea7548a5906db5b110591adb,
title = "Postdeposition annealing effect on CunSnSthin films grown at different substrate temperature",
abstract = "CunSnS(CZTS) thin films were deposited on top of Molybdenum (Mo) coated soda lime glass (SLG) substrates using a single target rf magnetron sputtering technique. The sputtering parameters such as base pressure, working pressure, rf power, argon (Ar) gas flow rate, and deposition time were kept consistent throughout the experiment. The effect of different substrate temperatures, for example, room temperature (RT), 300°C, 350°C, 370°C, 400°C, and 450°C, was analyzed by studying their structural, electrical, and optical properties. As-sputtered films were then annealed at 460°C. X-ray diffraction (XRD) measurement revealed the structure to be kesterite with peak of (112) plane in both annealed and as-sputtered CZTS thin films. The crystallinity of the films improved with the increasing substrate temperature until 370°C. Secondary phases of MoS Cu x MoS x, Cu x SnS x, Cu x S, and CuoSnS(hemusite) were also observed in the annealed CZTS films. Scanning electron microscopy (SEM) shows crystallite size of deposited CZTS thin film to be proportionally related to deposition temperature. The highest surface roughness of 67.318 nm is observed by atomic force microscopy (AFM). The conductivity type of the films was found to be p-type by Hall effect measurement system.",
author = "Nadi, {Samia Ahmed} and Puvaneswaran Chelvanathan and Zaihasraf Zakaria and Alam, {Mohammad Mezbaul} and Alothman, {Zeid A.} and Kamaruzzaman Sopian and Nowshad Amin",
year = "2014",
doi = "10.1155/2014/589027",
language = "English",
volume = "2014",
journal = "International Journal of Photoenergy",
issn = "1110-662X",
publisher = "Hindawi Publishing Corporation",

}

TY - JOUR

T1 - Postdeposition annealing effect on CunSnSthin films grown at different substrate temperature

AU - Nadi, Samia Ahmed

AU - Chelvanathan, Puvaneswaran

AU - Zakaria, Zaihasraf

AU - Alam, Mohammad Mezbaul

AU - Alothman, Zeid A.

AU - Sopian, Kamaruzzaman

AU - Amin, Nowshad

PY - 2014

Y1 - 2014

N2 - CunSnS(CZTS) thin films were deposited on top of Molybdenum (Mo) coated soda lime glass (SLG) substrates using a single target rf magnetron sputtering technique. The sputtering parameters such as base pressure, working pressure, rf power, argon (Ar) gas flow rate, and deposition time were kept consistent throughout the experiment. The effect of different substrate temperatures, for example, room temperature (RT), 300°C, 350°C, 370°C, 400°C, and 450°C, was analyzed by studying their structural, electrical, and optical properties. As-sputtered films were then annealed at 460°C. X-ray diffraction (XRD) measurement revealed the structure to be kesterite with peak of (112) plane in both annealed and as-sputtered CZTS thin films. The crystallinity of the films improved with the increasing substrate temperature until 370°C. Secondary phases of MoS Cu x MoS x, Cu x SnS x, Cu x S, and CuoSnS(hemusite) were also observed in the annealed CZTS films. Scanning electron microscopy (SEM) shows crystallite size of deposited CZTS thin film to be proportionally related to deposition temperature. The highest surface roughness of 67.318 nm is observed by atomic force microscopy (AFM). The conductivity type of the films was found to be p-type by Hall effect measurement system.

AB - CunSnS(CZTS) thin films were deposited on top of Molybdenum (Mo) coated soda lime glass (SLG) substrates using a single target rf magnetron sputtering technique. The sputtering parameters such as base pressure, working pressure, rf power, argon (Ar) gas flow rate, and deposition time were kept consistent throughout the experiment. The effect of different substrate temperatures, for example, room temperature (RT), 300°C, 350°C, 370°C, 400°C, and 450°C, was analyzed by studying their structural, electrical, and optical properties. As-sputtered films were then annealed at 460°C. X-ray diffraction (XRD) measurement revealed the structure to be kesterite with peak of (112) plane in both annealed and as-sputtered CZTS thin films. The crystallinity of the films improved with the increasing substrate temperature until 370°C. Secondary phases of MoS Cu x MoS x, Cu x SnS x, Cu x S, and CuoSnS(hemusite) were also observed in the annealed CZTS films. Scanning electron microscopy (SEM) shows crystallite size of deposited CZTS thin film to be proportionally related to deposition temperature. The highest surface roughness of 67.318 nm is observed by atomic force microscopy (AFM). The conductivity type of the films was found to be p-type by Hall effect measurement system.

UR - http://www.scopus.com/inward/record.url?scp=84901020371&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84901020371&partnerID=8YFLogxK

U2 - 10.1155/2014/589027

DO - 10.1155/2014/589027

M3 - Article

AN - SCOPUS:84901020371

VL - 2014

JO - International Journal of Photoenergy

JF - International Journal of Photoenergy

SN - 1110-662X

M1 - 589027

ER -