Physical properties of cuprous oxide thin films grown on n-Si substrate by sol-gel spin coating

D. S. Che Halin, I. A. Talib, A. R. Daud, Muhammad Azmi Abdul Hamid

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Cu2O films were grown on n-Si substrates via the sol-gel spin-coating method. The films were annealed under 5% H2 + 95% N2 atmosphere at 350°C, 450°C and 550°C. Difftactogram obtained by the grazing angle x-ray diffractometry showed that the crystallinity of the films increased with increasing annealing temperature. Scanning electron microscopy micrographs revealed that the Cu2O films contain grains of irregular size indicating that the film growth followed the Volmer-Weber growth mode. The micrographs showed the size evolved from irregular shapes with average size of 100 nm at 350°C into rectangular shapes with average size of 200 nm at 550°C. Optical reflectance for 450°C and 550°C film increased gradually at wavelength 480 nm. Higher reflectance for the 450°C film might be due to better coverage of the film. It also showed that optical absorption occured at wavelength below 480 nm.

Original languageEnglish
Pages (from-to)215-218
Number of pages4
JournalSains Malaysiana
Volume38
Issue number2
Publication statusPublished - Apr 2009

Fingerprint

coating
physical properties
gels
oxides
thin films
reflectance
grazing
wavelengths
crystallinity
optical absorption
atmospheres
scanning electron microscopy
annealing
x rays

Keywords

  • Crystallinity
  • Cuprous oxide
  • Sol-gel
  • Volmer-weber growth

ASJC Scopus subject areas

  • General

Cite this

Physical properties of cuprous oxide thin films grown on n-Si substrate by sol-gel spin coating. / Che Halin, D. S.; Talib, I. A.; Daud, A. R.; Abdul Hamid, Muhammad Azmi.

In: Sains Malaysiana, Vol. 38, No. 2, 04.2009, p. 215-218.

Research output: Contribution to journalArticle

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AB - Cu2O films were grown on n-Si substrates via the sol-gel spin-coating method. The films were annealed under 5% H2 + 95% N2 atmosphere at 350°C, 450°C and 550°C. Difftactogram obtained by the grazing angle x-ray diffractometry showed that the crystallinity of the films increased with increasing annealing temperature. Scanning electron microscopy micrographs revealed that the Cu2O films contain grains of irregular size indicating that the film growth followed the Volmer-Weber growth mode. The micrographs showed the size evolved from irregular shapes with average size of 100 nm at 350°C into rectangular shapes with average size of 200 nm at 550°C. Optical reflectance for 450°C and 550°C film increased gradually at wavelength 480 nm. Higher reflectance for the 450°C film might be due to better coverage of the film. It also showed that optical absorption occured at wavelength below 480 nm.

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