Phase identification and microstructure analysis of interface Al-Si/SiC composites

Yusof Abdullah, Abdul Razak Daud, Mohd B. Harun, Roslinda Shamsudin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Phase composition determined by X-ray diffraction (XRD) and microstructure analysis using scanning electron microscopy (SEM) have been performed on Al-Si/15% SiC composites prepared by stir casting method to investigate interface properties. Energy-dispersive X-ray spectroscopy (EDS) was also used to examine the product at interface where crystallisation was prominent. The interface reaction between particles and matrix was indicated that the nucleation of MgAl2O4, Mg2Si and MgO phases growth in the composites. These Interface reaction products play an important role to ensure good physical and mechanical properties of composites.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages189-192
Number of pages4
Volume1202
DOIs
Publication statusPublished - 2009
EventInternational Conference on Neutron and X-ray Scattering 2009, ICNX2009 - Kuala Lumpur
Duration: 29 Jun 20091 Jul 2009

Other

OtherInternational Conference on Neutron and X-ray Scattering 2009, ICNX2009
CityKuala Lumpur
Period29/6/091/7/09

Fingerprint

microstructure
composite materials
reaction products
x rays
physical properties
nucleation
mechanical properties
crystallization
scanning electron microscopy
products
matrices
diffraction
spectroscopy
energy

Keywords

  • Al-Si/SiC composite
  • Energy-dispersive X-ray spectroscopy
  • Interface
  • Microstructure
  • Phase identification
  • Scanning electron microscopy
  • X-ray diffraction

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Abdullah, Y., Daud, A. R., Harun, M. B., & Shamsudin, R. (2009). Phase identification and microstructure analysis of interface Al-Si/SiC composites. In AIP Conference Proceedings (Vol. 1202, pp. 189-192) https://doi.org/10.1063/1.3295596

Phase identification and microstructure analysis of interface Al-Si/SiC composites. / Abdullah, Yusof; Daud, Abdul Razak; Harun, Mohd B.; Shamsudin, Roslinda.

AIP Conference Proceedings. Vol. 1202 2009. p. 189-192.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abdullah, Y, Daud, AR, Harun, MB & Shamsudin, R 2009, Phase identification and microstructure analysis of interface Al-Si/SiC composites. in AIP Conference Proceedings. vol. 1202, pp. 189-192, International Conference on Neutron and X-ray Scattering 2009, ICNX2009, Kuala Lumpur, 29/6/09. https://doi.org/10.1063/1.3295596
Abdullah Y, Daud AR, Harun MB, Shamsudin R. Phase identification and microstructure analysis of interface Al-Si/SiC composites. In AIP Conference Proceedings. Vol. 1202. 2009. p. 189-192 https://doi.org/10.1063/1.3295596
Abdullah, Yusof ; Daud, Abdul Razak ; Harun, Mohd B. ; Shamsudin, Roslinda. / Phase identification and microstructure analysis of interface Al-Si/SiC composites. AIP Conference Proceedings. Vol. 1202 2009. pp. 189-192
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