On the use of MEMs accelerometer to detect fatigue

Aini Hussain, Farizah Saharil, Rahmat Hidayat Mokri, Burhanuddin Yeop Majlis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The main objective of this work is to perform a feasibility study on the use of head nodding signal from a single axis + 1g MEMS accelerometer to detect fatigue on set in individuals. This study involved recording and developing a data acquisition system to acquire signal from the accelerometer. It uses active and sleepy head movements as comparison and head nodding as the sign of fatigue. Statistical method has been used to analyze and identify the fatigue characteristics that are presence in the head-nodding signal acquired from the accelerometer. In addition, fractal analysis has been used to detect the onset of fatigue. The results show that fatigue on set can be detected using the head nodding signals and detection on individual is feasible using a 4% threshold criteria from the computed normalized fractal number.

Original languageEnglish
Title of host publicationProceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics
Pages631-635
Number of pages5
Publication statusPublished - 2004
Event2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004 - Kuala Lumpur
Duration: 4 Dec 20049 Dec 2004

Other

Other2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004
CityKuala Lumpur
Period4/12/049/12/04

Fingerprint

Accelerometers
Fatigue of materials
Fractals
MEMS
Data acquisition
Statistical methods

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Hussain, A., Saharil, F., Mokri, R. H., & Yeop Majlis, B. (2004). On the use of MEMs accelerometer to detect fatigue. In Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics (pp. 631-635). [1620966]

On the use of MEMs accelerometer to detect fatigue. / Hussain, Aini; Saharil, Farizah; Mokri, Rahmat Hidayat; Yeop Majlis, Burhanuddin.

Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. p. 631-635 1620966.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hussain, A, Saharil, F, Mokri, RH & Yeop Majlis, B 2004, On the use of MEMs accelerometer to detect fatigue. in Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics., 1620966, pp. 631-635, 2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004, Kuala Lumpur, 4/12/04.
Hussain A, Saharil F, Mokri RH, Yeop Majlis B. On the use of MEMs accelerometer to detect fatigue. In Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. p. 631-635. 1620966
Hussain, Aini ; Saharil, Farizah ; Mokri, Rahmat Hidayat ; Yeop Majlis, Burhanuddin. / On the use of MEMs accelerometer to detect fatigue. Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. pp. 631-635
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