On the use of a mixed-mode approach for MEMS testing

Md Fokhrul Islam, M. A Mohd Ali

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)

    Abstract

    In the testing environment, test patterns are generated using techniques such as exhaustive, pseudo-random, deterministic and weighted random testing. Using deterministic testing technique, huge amount of memory space and lengthy testing time are required to generate and store large number of test patterns. On the other hand, pseudo-random technique reduces the number of test patterns but cannot achieve complete fault coverage. Hence primitive polynomial linear feedback shift register (LFSR) based pseudo-random and deterministic techniques have recently been proposed to be used simultaneously. This has been referred to as the mixed-mode approach. This paper introduces the adaptation of the mixed-mode test technique for MEMS testing.

    Original languageEnglish
    Title of host publicationIEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
    Pages62-65
    Number of pages4
    DOIs
    Publication statusPublished - 2006
    Event2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006 - Kuala Lumpur
    Duration: 29 Nov 20061 Dec 2006

    Other

    Other2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006
    CityKuala Lumpur
    Period29/11/061/12/06

    Fingerprint

    MEMS
    Testing
    Shift registers
    Polynomials
    Feedback
    Data storage equipment

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Islam, M. F., & Ali, M. A. M. (2006). On the use of a mixed-mode approach for MEMS testing. In IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE (pp. 62-65). [4266570] https://doi.org/10.1109/SMELEC.2006.381020

    On the use of a mixed-mode approach for MEMS testing. / Islam, Md Fokhrul; Ali, M. A Mohd.

    IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. p. 62-65 4266570.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Islam, MF & Ali, MAM 2006, On the use of a mixed-mode approach for MEMS testing. in IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE., 4266570, pp. 62-65, 2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006, Kuala Lumpur, 29/11/06. https://doi.org/10.1109/SMELEC.2006.381020
    Islam MF, Ali MAM. On the use of a mixed-mode approach for MEMS testing. In IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. p. 62-65. 4266570 https://doi.org/10.1109/SMELEC.2006.381020
    Islam, Md Fokhrul ; Ali, M. A Mohd. / On the use of a mixed-mode approach for MEMS testing. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. pp. 62-65
    @inproceedings{1a240fd3db5340f0a3521ca7a048566f,
    title = "On the use of a mixed-mode approach for MEMS testing",
    abstract = "In the testing environment, test patterns are generated using techniques such as exhaustive, pseudo-random, deterministic and weighted random testing. Using deterministic testing technique, huge amount of memory space and lengthy testing time are required to generate and store large number of test patterns. On the other hand, pseudo-random technique reduces the number of test patterns but cannot achieve complete fault coverage. Hence primitive polynomial linear feedback shift register (LFSR) based pseudo-random and deterministic techniques have recently been proposed to be used simultaneously. This has been referred to as the mixed-mode approach. This paper introduces the adaptation of the mixed-mode test technique for MEMS testing.",
    author = "Islam, {Md Fokhrul} and Ali, {M. A Mohd}",
    year = "2006",
    doi = "10.1109/SMELEC.2006.381020",
    language = "English",
    isbn = "0780397312",
    pages = "62--65",
    booktitle = "IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE",

    }

    TY - GEN

    T1 - On the use of a mixed-mode approach for MEMS testing

    AU - Islam, Md Fokhrul

    AU - Ali, M. A Mohd

    PY - 2006

    Y1 - 2006

    N2 - In the testing environment, test patterns are generated using techniques such as exhaustive, pseudo-random, deterministic and weighted random testing. Using deterministic testing technique, huge amount of memory space and lengthy testing time are required to generate and store large number of test patterns. On the other hand, pseudo-random technique reduces the number of test patterns but cannot achieve complete fault coverage. Hence primitive polynomial linear feedback shift register (LFSR) based pseudo-random and deterministic techniques have recently been proposed to be used simultaneously. This has been referred to as the mixed-mode approach. This paper introduces the adaptation of the mixed-mode test technique for MEMS testing.

    AB - In the testing environment, test patterns are generated using techniques such as exhaustive, pseudo-random, deterministic and weighted random testing. Using deterministic testing technique, huge amount of memory space and lengthy testing time are required to generate and store large number of test patterns. On the other hand, pseudo-random technique reduces the number of test patterns but cannot achieve complete fault coverage. Hence primitive polynomial linear feedback shift register (LFSR) based pseudo-random and deterministic techniques have recently been proposed to be used simultaneously. This has been referred to as the mixed-mode approach. This paper introduces the adaptation of the mixed-mode test technique for MEMS testing.

    UR - http://www.scopus.com/inward/record.url?scp=35148871248&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=35148871248&partnerID=8YFLogxK

    U2 - 10.1109/SMELEC.2006.381020

    DO - 10.1109/SMELEC.2006.381020

    M3 - Conference contribution

    SN - 0780397312

    SN - 9780780397316

    SP - 62

    EP - 65

    BT - IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE

    ER -