Near-field scanning of stochastic fields considering reduction of complexity

David W.P. Thomas, Mohd Hafiz Baharuddin, Christopher Smartt, Gabriele Gradoni, Gregor Tanner, Stephen Creagh, Nebojsa Doncov, Michael Haider, Johannes A. Russer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Near-field scanning is an established technique for the efficient and accurate measurement of the radiated emissions from electronic equipment for EMC studies. Recently the use of two probes near-field has been developed for the measurement of field correlation for electronic equipment with many uncorrelated sources that essentially have a stochastic field distribution. The use of two probe scanning is however very time consuming and requires large computer resources. In this paper a study is made of the emissions from typical electronic devices to look at methods for reducing the complexity of measurement of stochastic fields.

Original languageEnglish
Title of host publication2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538606896
DOIs
Publication statusPublished - 2 Nov 2017
Externally publishedYes
Event2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC Europe 2017 - Angers, France
Duration: 4 Sep 20178 Sep 2017

Other

Other2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC Europe 2017
CountryFrance
CityAngers
Period4/9/178/9/17

Fingerprint

electronic equipment
near fields
Scanning
scanning
Electronic equipment
probes
Electromagnetic compatibility
resources
electronics

Keywords

  • Near field scanning
  • Printed circuit boards
  • Radiated emission
  • Stochastic fields
  • Time domain measurement

ASJC Scopus subject areas

  • Instrumentation
  • Radiation
  • Computer Networks and Communications

Cite this

Thomas, D. W. P., Baharuddin, M. H., Smartt, C., Gradoni, G., Tanner, G., Creagh, S., ... Russer, J. A. (2017). Near-field scanning of stochastic fields considering reduction of complexity. In 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017 [8094766] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMCEurope.2017.8094766

Near-field scanning of stochastic fields considering reduction of complexity. / Thomas, David W.P.; Baharuddin, Mohd Hafiz; Smartt, Christopher; Gradoni, Gabriele; Tanner, Gregor; Creagh, Stephen; Doncov, Nebojsa; Haider, Michael; Russer, Johannes A.

2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 8094766.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thomas, DWP, Baharuddin, MH, Smartt, C, Gradoni, G, Tanner, G, Creagh, S, Doncov, N, Haider, M & Russer, JA 2017, Near-field scanning of stochastic fields considering reduction of complexity. in 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017., 8094766, Institute of Electrical and Electronics Engineers Inc., 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC Europe 2017, Angers, France, 4/9/17. https://doi.org/10.1109/EMCEurope.2017.8094766
Thomas DWP, Baharuddin MH, Smartt C, Gradoni G, Tanner G, Creagh S et al. Near-field scanning of stochastic fields considering reduction of complexity. In 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017. Institute of Electrical and Electronics Engineers Inc. 2017. 8094766 https://doi.org/10.1109/EMCEurope.2017.8094766
Thomas, David W.P. ; Baharuddin, Mohd Hafiz ; Smartt, Christopher ; Gradoni, Gabriele ; Tanner, Gregor ; Creagh, Stephen ; Doncov, Nebojsa ; Haider, Michael ; Russer, Johannes A. / Near-field scanning of stochastic fields considering reduction of complexity. 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017. Institute of Electrical and Electronics Engineers Inc., 2017.
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