Morphology and optical studies of (1-x)ZnAl2O4 - xSiO2 thin films prepared by sol-gel method

Mohd Syafiq Zulfakar, Huda Abdullah, Wan Nasarudin Wan Jalal, Sahbudin Shaari, Zalita Zainuddin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The effect of morphological structures and optical band gap of (1-x)ZnAl2O4 - xSiO2 samples with compositions of x = 0.00, 0.05, 0.10 and 0.15 were prepared by sol-gel method. Spin coating technique was used to deposited the (1-x)ZnAl2O4 - xSiO2 as a thin film and to investigate the structural and optical band gap. The produced thin film samples were annealed at 450 °C for 1h. Field emission scanning electron microscope (FESEM) was used to investigate the surface morphology of the samples. The average particle size for (1-x)ZnAl2O4 - xSiO2 is about 331.23 nm. The particle size are tend to increase as the composition of SiO2 increased. XRD analysis shows the formation of cubic structure phase and dominant peak has been observed with Miller Indices (311) plane. The average crystallite size, D was calculated with average size about 8 - 13 nm. The optical band gap was calculated for (1-x)ZnAl2O4 - xSiO2 samples and it was found within range of 3.34 to 3.94 eV.

Original languageEnglish
Title of host publicationAdvanced Materials Research
Pages63-68
Number of pages6
Volume895
DOIs
Publication statusPublished - 2014
Event4th International Conference on Solid State Science and Technology, ICSSST 2012 - Melaka
Duration: 18 Dec 201320 Dec 2013

Publication series

NameAdvanced Materials Research
Volume895
ISSN (Print)10226680

Other

Other4th International Conference on Solid State Science and Technology, ICSSST 2012
CityMelaka
Period18/12/1320/12/13

Fingerprint

Optical band gaps
Sol-gel process
Thin films
Particle size
Coating techniques
Spin coating
Phase structure
Crystallite size
Chemical analysis
Field emission
Surface morphology
Electron microscopes
Scanning

Keywords

  • Energy bandgap
  • Sol-gel method
  • Surface morphology
  • Zinc aluminate

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Zulfakar, M. S., Abdullah, H., Wan Jalal, W. N., Shaari, S., & Zainuddin, Z. (2014). Morphology and optical studies of (1-x)ZnAl2O4 - xSiO2 thin films prepared by sol-gel method. In Advanced Materials Research (Vol. 895, pp. 63-68). (Advanced Materials Research; Vol. 895). https://doi.org/10.4028/www.scientific.net/AMR.895.63

Morphology and optical studies of (1-x)ZnAl2O4 - xSiO2 thin films prepared by sol-gel method. / Zulfakar, Mohd Syafiq; Abdullah, Huda; Wan Jalal, Wan Nasarudin; Shaari, Sahbudin; Zainuddin, Zalita.

Advanced Materials Research. Vol. 895 2014. p. 63-68 (Advanced Materials Research; Vol. 895).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zulfakar, MS, Abdullah, H, Wan Jalal, WN, Shaari, S & Zainuddin, Z 2014, Morphology and optical studies of (1-x)ZnAl2O4 - xSiO2 thin films prepared by sol-gel method. in Advanced Materials Research. vol. 895, Advanced Materials Research, vol. 895, pp. 63-68, 4th International Conference on Solid State Science and Technology, ICSSST 2012, Melaka, 18/12/13. https://doi.org/10.4028/www.scientific.net/AMR.895.63
Zulfakar MS, Abdullah H, Wan Jalal WN, Shaari S, Zainuddin Z. Morphology and optical studies of (1-x)ZnAl2O4 - xSiO2 thin films prepared by sol-gel method. In Advanced Materials Research. Vol. 895. 2014. p. 63-68. (Advanced Materials Research). https://doi.org/10.4028/www.scientific.net/AMR.895.63
Zulfakar, Mohd Syafiq ; Abdullah, Huda ; Wan Jalal, Wan Nasarudin ; Shaari, Sahbudin ; Zainuddin, Zalita. / Morphology and optical studies of (1-x)ZnAl2O4 - xSiO2 thin films prepared by sol-gel method. Advanced Materials Research. Vol. 895 2014. pp. 63-68 (Advanced Materials Research).
@inproceedings{00eb162c05d54e528c5c247995289384,
title = "Morphology and optical studies of (1-x)ZnAl2O4 - xSiO2 thin films prepared by sol-gel method",
abstract = "The effect of morphological structures and optical band gap of (1-x)ZnAl2O4 - xSiO2 samples with compositions of x = 0.00, 0.05, 0.10 and 0.15 were prepared by sol-gel method. Spin coating technique was used to deposited the (1-x)ZnAl2O4 - xSiO2 as a thin film and to investigate the structural and optical band gap. The produced thin film samples were annealed at 450 °C for 1h. Field emission scanning electron microscope (FESEM) was used to investigate the surface morphology of the samples. The average particle size for (1-x)ZnAl2O4 - xSiO2 is about 331.23 nm. The particle size are tend to increase as the composition of SiO2 increased. XRD analysis shows the formation of cubic structure phase and dominant peak has been observed with Miller Indices (311) plane. The average crystallite size, D was calculated with average size about 8 - 13 nm. The optical band gap was calculated for (1-x)ZnAl2O4 - xSiO2 samples and it was found within range of 3.34 to 3.94 eV.",
keywords = "Energy bandgap, Sol-gel method, Surface morphology, Zinc aluminate",
author = "Zulfakar, {Mohd Syafiq} and Huda Abdullah and {Wan Jalal}, {Wan Nasarudin} and Sahbudin Shaari and Zalita Zainuddin",
year = "2014",
doi = "10.4028/www.scientific.net/AMR.895.63",
language = "English",
isbn = "9783038350330",
volume = "895",
series = "Advanced Materials Research",
pages = "63--68",
booktitle = "Advanced Materials Research",

}

TY - GEN

T1 - Morphology and optical studies of (1-x)ZnAl2O4 - xSiO2 thin films prepared by sol-gel method

AU - Zulfakar, Mohd Syafiq

AU - Abdullah, Huda

AU - Wan Jalal, Wan Nasarudin

AU - Shaari, Sahbudin

AU - Zainuddin, Zalita

PY - 2014

Y1 - 2014

N2 - The effect of morphological structures and optical band gap of (1-x)ZnAl2O4 - xSiO2 samples with compositions of x = 0.00, 0.05, 0.10 and 0.15 were prepared by sol-gel method. Spin coating technique was used to deposited the (1-x)ZnAl2O4 - xSiO2 as a thin film and to investigate the structural and optical band gap. The produced thin film samples were annealed at 450 °C for 1h. Field emission scanning electron microscope (FESEM) was used to investigate the surface morphology of the samples. The average particle size for (1-x)ZnAl2O4 - xSiO2 is about 331.23 nm. The particle size are tend to increase as the composition of SiO2 increased. XRD analysis shows the formation of cubic structure phase and dominant peak has been observed with Miller Indices (311) plane. The average crystallite size, D was calculated with average size about 8 - 13 nm. The optical band gap was calculated for (1-x)ZnAl2O4 - xSiO2 samples and it was found within range of 3.34 to 3.94 eV.

AB - The effect of morphological structures and optical band gap of (1-x)ZnAl2O4 - xSiO2 samples with compositions of x = 0.00, 0.05, 0.10 and 0.15 were prepared by sol-gel method. Spin coating technique was used to deposited the (1-x)ZnAl2O4 - xSiO2 as a thin film and to investigate the structural and optical band gap. The produced thin film samples were annealed at 450 °C for 1h. Field emission scanning electron microscope (FESEM) was used to investigate the surface morphology of the samples. The average particle size for (1-x)ZnAl2O4 - xSiO2 is about 331.23 nm. The particle size are tend to increase as the composition of SiO2 increased. XRD analysis shows the formation of cubic structure phase and dominant peak has been observed with Miller Indices (311) plane. The average crystallite size, D was calculated with average size about 8 - 13 nm. The optical band gap was calculated for (1-x)ZnAl2O4 - xSiO2 samples and it was found within range of 3.34 to 3.94 eV.

KW - Energy bandgap

KW - Sol-gel method

KW - Surface morphology

KW - Zinc aluminate

UR - http://www.scopus.com/inward/record.url?scp=84896809319&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84896809319&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/AMR.895.63

DO - 10.4028/www.scientific.net/AMR.895.63

M3 - Conference contribution

SN - 9783038350330

VL - 895

T3 - Advanced Materials Research

SP - 63

EP - 68

BT - Advanced Materials Research

ER -