Magnetoresistance effect of Cu/Cu-Co hybrid multilayer films

S. A. Halim, K. P. Lim, Huda Abdullah, O. J. Lee, E. B. Saion, Z. A. Talib, Z. Abbas, Abdullah Cik

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A series of hybrid multilayers of CuCo/Cu had been fabricated using RF magnetron sputtering technique. Investigation on it film's surface morphology, structural and magnetoresistance properties had been carried out using atomic force microscope (AFM), X-ray diffraction (XRD) and four-point probe method. AFM image show that Cu layer consist of uniform size of particles size distribution, However, the CuCo show broad particles size distribution. XRD spectrum shows that both Cu and CuCo layers is Cu(111), Cu(200) and Cu(220) oriented with the formation of Cu(111) structure is dominant. The GMR ratio for all sample are small. The highest GMR value of -0.6% is obtained for sample with 5 layers. It is believed to be due to the formation of superparamagnetic particles in the sample that needed higher magnetic field to saturate it. The results also show that number of layer did not influence much to improve the GMR value.

Original languageEnglish
Title of host publicationProceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics
Pages494-496
Number of pages3
Publication statusPublished - 2004
Externally publishedYes
Event2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004 - Kuala Lumpur
Duration: 4 Dec 20049 Dec 2004

Other

Other2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004
CityKuala Lumpur
Period4/12/049/12/04

Fingerprint

Multilayer films
Magnetoresistance
Particle size analysis
Microscopes
X ray diffraction
Magnetron sputtering
Surface morphology
Multilayers
Magnetic fields

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Halim, S. A., Lim, K. P., Abdullah, H., Lee, O. J., Saion, E. B., Talib, Z. A., ... Cik, A. (2004). Magnetoresistance effect of Cu/Cu-Co hybrid multilayer films. In Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics (pp. 494-496). [1620934]

Magnetoresistance effect of Cu/Cu-Co hybrid multilayer films. / Halim, S. A.; Lim, K. P.; Abdullah, Huda; Lee, O. J.; Saion, E. B.; Talib, Z. A.; Abbas, Z.; Cik, Abdullah.

Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. p. 494-496 1620934.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Halim, SA, Lim, KP, Abdullah, H, Lee, OJ, Saion, EB, Talib, ZA, Abbas, Z & Cik, A 2004, Magnetoresistance effect of Cu/Cu-Co hybrid multilayer films. in Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics., 1620934, pp. 494-496, 2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004, Kuala Lumpur, 4/12/04.
Halim SA, Lim KP, Abdullah H, Lee OJ, Saion EB, Talib ZA et al. Magnetoresistance effect of Cu/Cu-Co hybrid multilayer films. In Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. p. 494-496. 1620934
Halim, S. A. ; Lim, K. P. ; Abdullah, Huda ; Lee, O. J. ; Saion, E. B. ; Talib, Z. A. ; Abbas, Z. ; Cik, Abdullah. / Magnetoresistance effect of Cu/Cu-Co hybrid multilayer films. Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. pp. 494-496
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AU - Talib, Z. A.

AU - Abbas, Z.

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