Influence of thermal annealing on CdTe thin film deposited by thermal evaporation technique

K. S. Rahman, F. Haque, N. A. Khan, M. A. Islam, M. M. Alam, Z. A. AlOthman, Kamaruzzaman Sopian, Nowshad Amin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Effects of thermal annealing on the structural andoptical properties of thermally evaporated CdTe thin films are presented here. Thin films of CdTe were deposited on soda lime glass substrates at room temperature by varying the deposition current ranging from 25 Amperes to 30 Amperes by thermal evaporation. The grown samples were annealed at the annealing temperature of 400°C for 15 minutes in a vacuum furnace of nitrogen ambient with pressure of 250-300 mTorr. The structural, optical and electrical properties of the grown samples were investigated by XRD, AFM and UV-VIS spectrometry. The as-deposited films prepared at deposition current 25A shows polycrystalline nature whereas the films prepared at 28A and 30A exhibit cubic crystallinity with (111) preferential orientation around 2θ=23.8°. The surface roughness of the films is also highly affected by the thermal annealing as observed from the AFM images. The band gap has been found around 1.5 eV for the as-deposited film whereas the band gap decreased approximately to 1.4 eV after thermal annealing treatment.

Original languageEnglish
Title of host publicationProceedings of 2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9789843378675
Publication statusPublished - 21 Jul 2014
Event2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014 - Dhaka
Duration: 29 May 201431 May 2014

Other

Other2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014
CityDhaka
Period29/5/1431/5/14

Fingerprint

Thermal evaporation
Annealing
Thin films
Structural properties
Energy gap
Vacuum furnaces
Lime
Spectrometry
Electric properties
Optical properties
Surface roughness
Nitrogen
Glass
Temperature
Hot Temperature
Thin Films
Substrates
Deposition

Keywords

  • CdTe thin film
  • Solar cell
  • Thermal annealing
  • Thermal evaporation

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Classics

Cite this

Rahman, K. S., Haque, F., Khan, N. A., Islam, M. A., Alam, M. M., AlOthman, Z. A., ... Amin, N. (2014). Influence of thermal annealing on CdTe thin film deposited by thermal evaporation technique. In Proceedings of 2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014 [6861722] Institute of Electrical and Electronics Engineers Inc..

Influence of thermal annealing on CdTe thin film deposited by thermal evaporation technique. / Rahman, K. S.; Haque, F.; Khan, N. A.; Islam, M. A.; Alam, M. M.; AlOthman, Z. A.; Sopian, Kamaruzzaman; Amin, Nowshad.

Proceedings of 2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014. Institute of Electrical and Electronics Engineers Inc., 2014. 6861722.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Rahman, KS, Haque, F, Khan, NA, Islam, MA, Alam, MM, AlOthman, ZA, Sopian, K & Amin, N 2014, Influence of thermal annealing on CdTe thin film deposited by thermal evaporation technique. in Proceedings of 2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014., 6861722, Institute of Electrical and Electronics Engineers Inc., 2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014, Dhaka, 29/5/14.
Rahman KS, Haque F, Khan NA, Islam MA, Alam MM, AlOthman ZA et al. Influence of thermal annealing on CdTe thin film deposited by thermal evaporation technique. In Proceedings of 2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014. Institute of Electrical and Electronics Engineers Inc. 2014. 6861722
Rahman, K. S. ; Haque, F. ; Khan, N. A. ; Islam, M. A. ; Alam, M. M. ; AlOthman, Z. A. ; Sopian, Kamaruzzaman ; Amin, Nowshad. / Influence of thermal annealing on CdTe thin film deposited by thermal evaporation technique. Proceedings of 2014 3rd International Conference on the Developments in Renewable Energy Technology, ICDRET 2014. Institute of Electrical and Electronics Engineers Inc., 2014.
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AU - AlOthman, Z. A.

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AU - Amin, Nowshad

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N2 - Effects of thermal annealing on the structural andoptical properties of thermally evaporated CdTe thin films are presented here. Thin films of CdTe were deposited on soda lime glass substrates at room temperature by varying the deposition current ranging from 25 Amperes to 30 Amperes by thermal evaporation. The grown samples were annealed at the annealing temperature of 400°C for 15 minutes in a vacuum furnace of nitrogen ambient with pressure of 250-300 mTorr. The structural, optical and electrical properties of the grown samples were investigated by XRD, AFM and UV-VIS spectrometry. The as-deposited films prepared at deposition current 25A shows polycrystalline nature whereas the films prepared at 28A and 30A exhibit cubic crystallinity with (111) preferential orientation around 2θ=23.8°. The surface roughness of the films is also highly affected by the thermal annealing as observed from the AFM images. The band gap has been found around 1.5 eV for the as-deposited film whereas the band gap decreased approximately to 1.4 eV after thermal annealing treatment.

AB - Effects of thermal annealing on the structural andoptical properties of thermally evaporated CdTe thin films are presented here. Thin films of CdTe were deposited on soda lime glass substrates at room temperature by varying the deposition current ranging from 25 Amperes to 30 Amperes by thermal evaporation. The grown samples were annealed at the annealing temperature of 400°C for 15 minutes in a vacuum furnace of nitrogen ambient with pressure of 250-300 mTorr. The structural, optical and electrical properties of the grown samples were investigated by XRD, AFM and UV-VIS spectrometry. The as-deposited films prepared at deposition current 25A shows polycrystalline nature whereas the films prepared at 28A and 30A exhibit cubic crystallinity with (111) preferential orientation around 2θ=23.8°. The surface roughness of the films is also highly affected by the thermal annealing as observed from the AFM images. The band gap has been found around 1.5 eV for the as-deposited film whereas the band gap decreased approximately to 1.4 eV after thermal annealing treatment.

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