High transparency iron doped indium oxide (In2-xFe xO3, x = 0.0, 0.05, 0.25, 0.35 and 0.45) films prepared by the sol-gel method

Noor Baa`Yah Ibrahim, H. Baqiah, M. H. Abdullah

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm.

Original languageEnglish
Pages (from-to)961-966
Number of pages6
JournalSains Malaysiana
Volume42
Issue number7
Publication statusPublished - Jul 2013

Fingerprint

indium oxides
gels
iron
diffractometers
coating
crystallinity
grain size
atomic force microscopy
wavelengths
spectroscopy
x rays

Keywords

  • Crystallization
  • Indium oxide
  • Transmission

ASJC Scopus subject areas

  • General

Cite this

High transparency iron doped indium oxide (In2-xFe xO3, x = 0.0, 0.05, 0.25, 0.35 and 0.45) films prepared by the sol-gel method. / Ibrahim, Noor Baa`Yah; Baqiah, H.; Abdullah, M. H.

In: Sains Malaysiana, Vol. 42, No. 7, 07.2013, p. 961-966.

Research output: Contribution to journalArticle

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