Framework for intelligent meaningful test data generation model-IMTDG

Shihab A. Hameed, Aziz Deraman, Abdul Razak Hamdan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The generation of actual test data is one of the difficult and expensive parts of applying software-testing techniques. Many of the current test data generators focus firstly on data type and structure regardless of the meaning and secondly on developer or database administrator viewpoints regardless of the user concerns. This leads to generate a high ratio of meaningless test data, especially when generating non-numeric data, which may not reflect the specification, or environment of the population under test besides the reduction of user confidence in the generated data and testing as all. In this paper we propose a framework for intelligent meaningful test data generation model with the aim of increasing the users confidence in software testing. The model uses samples of real data as a resource data and set of efficient generation techniques based on statistical methods such as permutations, combination, sampling, and statistical distributions. Selection of the suitable structure and generation technique is based on one of the intelligent soft computing techniques such as fuzzy logic, neural network, or genetic algorithm. The generated test data will be close to the real world for testing processes with the ability of simulating real environments.

Original languageEnglish
Title of host publicationIEEE Region 10 Annual International Conference, Proceedings/TENCON
Volume2
Publication statusPublished - 2000
Externally publishedYes
Event2000 TENCON Proceedings - Kuala Lumpur, Malaysia
Duration: 24 Sep 200027 Sep 2000

Other

Other2000 TENCON Proceedings
CityKuala Lumpur, Malaysia
Period24/9/0027/9/00

Fingerprint

Software testing
Soft computing
Testing
Fuzzy logic
Statistical methods
Genetic algorithms
Sampling
Neural networks
Specifications

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Hameed, S. A., Deraman, A., & Hamdan, A. R. (2000). Framework for intelligent meaningful test data generation model-IMTDG. In IEEE Region 10 Annual International Conference, Proceedings/TENCON (Vol. 2)

Framework for intelligent meaningful test data generation model-IMTDG. / Hameed, Shihab A.; Deraman, Aziz; Hamdan, Abdul Razak.

IEEE Region 10 Annual International Conference, Proceedings/TENCON. Vol. 2 2000.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hameed, SA, Deraman, A & Hamdan, AR 2000, Framework for intelligent meaningful test data generation model-IMTDG. in IEEE Region 10 Annual International Conference, Proceedings/TENCON. vol. 2, 2000 TENCON Proceedings, Kuala Lumpur, Malaysia, 24/9/00.
Hameed SA, Deraman A, Hamdan AR. Framework for intelligent meaningful test data generation model-IMTDG. In IEEE Region 10 Annual International Conference, Proceedings/TENCON. Vol. 2. 2000
Hameed, Shihab A. ; Deraman, Aziz ; Hamdan, Abdul Razak. / Framework for intelligent meaningful test data generation model-IMTDG. IEEE Region 10 Annual International Conference, Proceedings/TENCON. Vol. 2 2000.
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