FEM analysis for the influence of manufacturing process defects on dynamic behavior of thin chromium microbeam

H. Bourouina, R. Yahiaoui, Burhanuddin Yeop Majlis, A. Hassein-Bey, M. E A Benamar, A. Sahar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper identifies and investigates the influence of technological defects of manufacturing process on the dynamic behavior of thin chromium microbeam. The analytical models will be analyzed and corrected using finite element method (FEM) to determine their validity under influence of technological defects. A semi-analytical model will be proposed for the extraction of corrective factors from 3D FEM simulation of dynamic behavior of microbeam. Final results indicate that the correction of technological defects is very significant for Cr microbeam 80×2×0.95μm3. In other hand, the corrected value of Young's modulus is very close to the experimental results and it is about 279.1GPa.

Original languageEnglish
Title of host publicationApplied Mechanics and Materials
PublisherTrans Tech Publications
Pages958-962
Number of pages5
Volume548-549
ISBN (Print)9783038350842
DOIs
Publication statusPublished - 2014
Event3rd International Conference on Manufacturing Engineering and Process, ICMEP 2014 - Seoul
Duration: 10 Apr 201411 Apr 2014

Publication series

NameApplied Mechanics and Materials
Volume548-549
ISSN (Print)16609336
ISSN (Electronic)16627482

Other

Other3rd International Conference on Manufacturing Engineering and Process, ICMEP 2014
CitySeoul
Period10/4/1411/4/14

Fingerprint

Chromium
Finite element method
Defects
Analytical models
Elastic moduli

Keywords

  • FEM analysis
  • Manufacturing process
  • Mechanical properties
  • Rotation of cross-section
  • Technological defects

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Bourouina, H., Yahiaoui, R., Yeop Majlis, B., Hassein-Bey, A., Benamar, M. E. A., & Sahar, A. (2014). FEM analysis for the influence of manufacturing process defects on dynamic behavior of thin chromium microbeam. In Applied Mechanics and Materials (Vol. 548-549, pp. 958-962). (Applied Mechanics and Materials; Vol. 548-549). Trans Tech Publications. https://doi.org/10.4028/www.scientific.net/AMM.548-549.958

FEM analysis for the influence of manufacturing process defects on dynamic behavior of thin chromium microbeam. / Bourouina, H.; Yahiaoui, R.; Yeop Majlis, Burhanuddin; Hassein-Bey, A.; Benamar, M. E A; Sahar, A.

Applied Mechanics and Materials. Vol. 548-549 Trans Tech Publications, 2014. p. 958-962 (Applied Mechanics and Materials; Vol. 548-549).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bourouina, H, Yahiaoui, R, Yeop Majlis, B, Hassein-Bey, A, Benamar, MEA & Sahar, A 2014, FEM analysis for the influence of manufacturing process defects on dynamic behavior of thin chromium microbeam. in Applied Mechanics and Materials. vol. 548-549, Applied Mechanics and Materials, vol. 548-549, Trans Tech Publications, pp. 958-962, 3rd International Conference on Manufacturing Engineering and Process, ICMEP 2014, Seoul, 10/4/14. https://doi.org/10.4028/www.scientific.net/AMM.548-549.958
Bourouina H, Yahiaoui R, Yeop Majlis B, Hassein-Bey A, Benamar MEA, Sahar A. FEM analysis for the influence of manufacturing process defects on dynamic behavior of thin chromium microbeam. In Applied Mechanics and Materials. Vol. 548-549. Trans Tech Publications. 2014. p. 958-962. (Applied Mechanics and Materials). https://doi.org/10.4028/www.scientific.net/AMM.548-549.958
Bourouina, H. ; Yahiaoui, R. ; Yeop Majlis, Burhanuddin ; Hassein-Bey, A. ; Benamar, M. E A ; Sahar, A. / FEM analysis for the influence of manufacturing process defects on dynamic behavior of thin chromium microbeam. Applied Mechanics and Materials. Vol. 548-549 Trans Tech Publications, 2014. pp. 958-962 (Applied Mechanics and Materials).
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