FDTD simulation of Kretschmann based Cr-Ag-ITO SPR for refractive index sensor

S. M. Gan, P. S. Menon, N. R. Mohamad, N. A. Jamil, B. Y. Majlis

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

In this paper, a Kretschmann based surface plasmon resonance sensor using silver (Ag) and indium tin oxide (ITO) on chromium (Cr)-coated BK7 substrate has been analyzed for refractive index sensor. By numerical simulations, the thickness of the ITO layer along with Ag thin film have been optimized to achieve the best performance of the sensor in terms of sensitivity and Figure of Merit (FOM). The best sensor performance was achieved by Cr(0.5 nm/Ag(30 nm) with sensitivity value of 69.88°/RIU and FOM of 15.19 whereas Cr(0.5 nm)/Ag(30 nm)/ITO(10nm) gave sensitivity and FOM of 68.77°/RIU and 11.26, respectively. The deposition of Cr enhanced the attachment of Ag layer to prism whereas incorporating ITO on Cr/Ag sensor interface helps to protect the Ag layer from oxidation and preserve its sharp optical signal. Hence, this Ag based SPR interface with ITO coated can be useful for sensing refractive index changes for analyte detection.

Original languageEnglish
Pages (from-to)668-674
Number of pages7
JournalMaterials Today: Proceedings
Volume7
DOIs
Publication statusPublished - 1 Jan 2019
Event2018 Nanotech Malaysia - Kuala Lumpur, Malaysia
Duration: 7 May 20189 May 2018

Fingerprint

Chromium
Tin oxides
Indium
Refractive index
Sensors
Surface plasmon resonance
Prisms
Silver
indium tin oxide
Thin films
Oxidation
Computer simulation
Substrates

Keywords

  • Chromium
  • Indium Tin Oxide
  • Kretschmann configuration
  • Silver
  • Surface plasmon resonance

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

FDTD simulation of Kretschmann based Cr-Ag-ITO SPR for refractive index sensor. / Gan, S. M.; Menon, P. S.; Mohamad, N. R.; Jamil, N. A.; Majlis, B. Y.

In: Materials Today: Proceedings, Vol. 7, 01.01.2019, p. 668-674.

Research output: Contribution to journalConference article

@article{509d6eb4006142a68a15f51e454d1da6,
title = "FDTD simulation of Kretschmann based Cr-Ag-ITO SPR for refractive index sensor",
abstract = "In this paper, a Kretschmann based surface plasmon resonance sensor using silver (Ag) and indium tin oxide (ITO) on chromium (Cr)-coated BK7 substrate has been analyzed for refractive index sensor. By numerical simulations, the thickness of the ITO layer along with Ag thin film have been optimized to achieve the best performance of the sensor in terms of sensitivity and Figure of Merit (FOM). The best sensor performance was achieved by Cr(0.5 nm/Ag(30 nm) with sensitivity value of 69.88°/RIU and FOM of 15.19 whereas Cr(0.5 nm)/Ag(30 nm)/ITO(10nm) gave sensitivity and FOM of 68.77°/RIU and 11.26, respectively. The deposition of Cr enhanced the attachment of Ag layer to prism whereas incorporating ITO on Cr/Ag sensor interface helps to protect the Ag layer from oxidation and preserve its sharp optical signal. Hence, this Ag based SPR interface with ITO coated can be useful for sensing refractive index changes for analyte detection.",
keywords = "Chromium, Indium Tin Oxide, Kretschmann configuration, Silver, Surface plasmon resonance",
author = "Gan, {S. M.} and Menon, {P. S.} and Mohamad, {N. R.} and Jamil, {N. A.} and Majlis, {B. Y.}",
year = "2019",
month = "1",
day = "1",
doi = "10.1016/j.matpr.2018.12.059",
language = "English",
volume = "7",
pages = "668--674",
journal = "Materials Today: Proceedings",
issn = "2214-7853",
publisher = "Elsevier Limited",

}

TY - JOUR

T1 - FDTD simulation of Kretschmann based Cr-Ag-ITO SPR for refractive index sensor

AU - Gan, S. M.

AU - Menon, P. S.

AU - Mohamad, N. R.

AU - Jamil, N. A.

AU - Majlis, B. Y.

PY - 2019/1/1

Y1 - 2019/1/1

N2 - In this paper, a Kretschmann based surface plasmon resonance sensor using silver (Ag) and indium tin oxide (ITO) on chromium (Cr)-coated BK7 substrate has been analyzed for refractive index sensor. By numerical simulations, the thickness of the ITO layer along with Ag thin film have been optimized to achieve the best performance of the sensor in terms of sensitivity and Figure of Merit (FOM). The best sensor performance was achieved by Cr(0.5 nm/Ag(30 nm) with sensitivity value of 69.88°/RIU and FOM of 15.19 whereas Cr(0.5 nm)/Ag(30 nm)/ITO(10nm) gave sensitivity and FOM of 68.77°/RIU and 11.26, respectively. The deposition of Cr enhanced the attachment of Ag layer to prism whereas incorporating ITO on Cr/Ag sensor interface helps to protect the Ag layer from oxidation and preserve its sharp optical signal. Hence, this Ag based SPR interface with ITO coated can be useful for sensing refractive index changes for analyte detection.

AB - In this paper, a Kretschmann based surface plasmon resonance sensor using silver (Ag) and indium tin oxide (ITO) on chromium (Cr)-coated BK7 substrate has been analyzed for refractive index sensor. By numerical simulations, the thickness of the ITO layer along with Ag thin film have been optimized to achieve the best performance of the sensor in terms of sensitivity and Figure of Merit (FOM). The best sensor performance was achieved by Cr(0.5 nm/Ag(30 nm) with sensitivity value of 69.88°/RIU and FOM of 15.19 whereas Cr(0.5 nm)/Ag(30 nm)/ITO(10nm) gave sensitivity and FOM of 68.77°/RIU and 11.26, respectively. The deposition of Cr enhanced the attachment of Ag layer to prism whereas incorporating ITO on Cr/Ag sensor interface helps to protect the Ag layer from oxidation and preserve its sharp optical signal. Hence, this Ag based SPR interface with ITO coated can be useful for sensing refractive index changes for analyte detection.

KW - Chromium

KW - Indium Tin Oxide

KW - Kretschmann configuration

KW - Silver

KW - Surface plasmon resonance

UR - http://www.scopus.com/inward/record.url?scp=85069630339&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85069630339&partnerID=8YFLogxK

U2 - 10.1016/j.matpr.2018.12.059

DO - 10.1016/j.matpr.2018.12.059

M3 - Conference article

AN - SCOPUS:85069630339

VL - 7

SP - 668

EP - 674

JO - Materials Today: Proceedings

JF - Materials Today: Proceedings

SN - 2214-7853

ER -