Faults detection approach for self-testable RF MEMS

Syed Zahidul Islam, Wallace Wong, Su Hieng Tiong, Mohd Alauddin Mohd Ali

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)

    Abstract

    Efficient built-in or external test strategies are becoming essential in Micro-Electromechanical Systems (MEMS), especially for high reliability and safety critical applications. This paper describes self-testable and self-reparable RF MEMS fault testing approach. Simulation results show the effects of switches faults in MEMS.

    Original languageEnglish
    Title of host publicationIEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
    Pages329-333
    Number of pages5
    DOIs
    Publication statusPublished - 2006
    Event2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006 - Kuala Lumpur
    Duration: 29 Nov 20061 Dec 2006

    Other

    Other2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006
    CityKuala Lumpur
    Period29/11/061/12/06

    Fingerprint

    Fault detection
    MEMS
    Switches
    Testing

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Islam, S. Z., Wong, W., Tiong, S. H., & Ali, M. A. M. (2006). Faults detection approach for self-testable RF MEMS. In IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE (pp. 329-333). [4266625] https://doi.org/10.1109/SMELEC.2006.381075

    Faults detection approach for self-testable RF MEMS. / Islam, Syed Zahidul; Wong, Wallace; Tiong, Su Hieng; Ali, Mohd Alauddin Mohd.

    IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. p. 329-333 4266625.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Islam, SZ, Wong, W, Tiong, SH & Ali, MAM 2006, Faults detection approach for self-testable RF MEMS. in IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE., 4266625, pp. 329-333, 2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006, Kuala Lumpur, 29/11/06. https://doi.org/10.1109/SMELEC.2006.381075
    Islam SZ, Wong W, Tiong SH, Ali MAM. Faults detection approach for self-testable RF MEMS. In IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. p. 329-333. 4266625 https://doi.org/10.1109/SMELEC.2006.381075
    Islam, Syed Zahidul ; Wong, Wallace ; Tiong, Su Hieng ; Ali, Mohd Alauddin Mohd. / Faults detection approach for self-testable RF MEMS. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. pp. 329-333
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