Exploratory Data Analysis on Stochastic Emissions Near-Field Scanning Measurements

Jose A. Oliva, Marco A. Azperua, Marc Pous, Ferran Silva, Mohd Hafiz Baharuddin, C. Smartt, David W.P. Thomas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recently, near-field scanning techniques for measuring and analysing stochastic emissions have been theoretically and experimentally studied and they are promising in terms of the characterization and classification radiated emissions in densely integrated technologies. Nonetheless, one of their drawbacks is the volume of data generated by time-domain acquisitions made across the scanning grid. Moreover, there are a multiplicity of sources of systematic errors that can pass unnoticed in measurements and that could compromise the accuracy of the data used for post-processing. This paper presents a pre-evaluation procedure that follows an exploratory data analysis approach for detecting such errors using an objective statistical criterion when applied to stochastic emissions of near-field scanning measurement data. Results are presented using real measurement data from the scanning of an Arduino Intel Galileo board, as has been reported in previous studies. By performing the proposed analysis, significant errors were detected in the measurement data. Final remarks on the importance of performing quality clearance in the measurement data from stochastic emissions assessments are provided.

Original languageEnglish
Title of host publicationEMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages567-572
Number of pages6
Volume2018-August
ISBN (Electronic)9781467396974
DOIs
Publication statusPublished - 5 Oct 2018
Externally publishedYes
Event2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018 - Amsterdam, Netherlands
Duration: 27 Aug 201830 Aug 2018

Other

Other2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018
CountryNetherlands
CityAmsterdam
Period27/8/1830/8/18

Fingerprint

near fields
Scanning
scanning
Systematic errors
Error analysis
error analysis
clearances
systematic errors
acquisition
grids
Processing
evaluation

Keywords

  • Near-field scanning
  • radiated emissions
  • stochastic fields
  • time-domain measurements

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Oliva, J. A., Azperua, M. A., Pous, M., Silva, F., Baharuddin, M. H., Smartt, C., & Thomas, D. W. P. (2018). Exploratory Data Analysis on Stochastic Emissions Near-Field Scanning Measurements. In EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility (Vol. 2018-August, pp. 567-572). [8485066] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMCEurope.2018.8485066

Exploratory Data Analysis on Stochastic Emissions Near-Field Scanning Measurements. / Oliva, Jose A.; Azperua, Marco A.; Pous, Marc; Silva, Ferran; Baharuddin, Mohd Hafiz; Smartt, C.; Thomas, David W.P.

EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility. Vol. 2018-August Institute of Electrical and Electronics Engineers Inc., 2018. p. 567-572 8485066.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Oliva, JA, Azperua, MA, Pous, M, Silva, F, Baharuddin, MH, Smartt, C & Thomas, DWP 2018, Exploratory Data Analysis on Stochastic Emissions Near-Field Scanning Measurements. in EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility. vol. 2018-August, 8485066, Institute of Electrical and Electronics Engineers Inc., pp. 567-572, 2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018, Amsterdam, Netherlands, 27/8/18. https://doi.org/10.1109/EMCEurope.2018.8485066
Oliva JA, Azperua MA, Pous M, Silva F, Baharuddin MH, Smartt C et al. Exploratory Data Analysis on Stochastic Emissions Near-Field Scanning Measurements. In EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility. Vol. 2018-August. Institute of Electrical and Electronics Engineers Inc. 2018. p. 567-572. 8485066 https://doi.org/10.1109/EMCEurope.2018.8485066
Oliva, Jose A. ; Azperua, Marco A. ; Pous, Marc ; Silva, Ferran ; Baharuddin, Mohd Hafiz ; Smartt, C. ; Thomas, David W.P. / Exploratory Data Analysis on Stochastic Emissions Near-Field Scanning Measurements. EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility. Vol. 2018-August Institute of Electrical and Electronics Engineers Inc., 2018. pp. 567-572
@inproceedings{053672d6e7624aae9f804398ef8ed6f9,
title = "Exploratory Data Analysis on Stochastic Emissions Near-Field Scanning Measurements",
abstract = "Recently, near-field scanning techniques for measuring and analysing stochastic emissions have been theoretically and experimentally studied and they are promising in terms of the characterization and classification radiated emissions in densely integrated technologies. Nonetheless, one of their drawbacks is the volume of data generated by time-domain acquisitions made across the scanning grid. Moreover, there are a multiplicity of sources of systematic errors that can pass unnoticed in measurements and that could compromise the accuracy of the data used for post-processing. This paper presents a pre-evaluation procedure that follows an exploratory data analysis approach for detecting such errors using an objective statistical criterion when applied to stochastic emissions of near-field scanning measurement data. Results are presented using real measurement data from the scanning of an Arduino Intel Galileo board, as has been reported in previous studies. By performing the proposed analysis, significant errors were detected in the measurement data. Final remarks on the importance of performing quality clearance in the measurement data from stochastic emissions assessments are provided.",
keywords = "Near-field scanning, radiated emissions, stochastic fields, time-domain measurements",
author = "Oliva, {Jose A.} and Azperua, {Marco A.} and Marc Pous and Ferran Silva and Baharuddin, {Mohd Hafiz} and C. Smartt and Thomas, {David W.P.}",
year = "2018",
month = "10",
day = "5",
doi = "10.1109/EMCEurope.2018.8485066",
language = "English",
volume = "2018-August",
pages = "567--572",
booktitle = "EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

TY - GEN

T1 - Exploratory Data Analysis on Stochastic Emissions Near-Field Scanning Measurements

AU - Oliva, Jose A.

AU - Azperua, Marco A.

AU - Pous, Marc

AU - Silva, Ferran

AU - Baharuddin, Mohd Hafiz

AU - Smartt, C.

AU - Thomas, David W.P.

PY - 2018/10/5

Y1 - 2018/10/5

N2 - Recently, near-field scanning techniques for measuring and analysing stochastic emissions have been theoretically and experimentally studied and they are promising in terms of the characterization and classification radiated emissions in densely integrated technologies. Nonetheless, one of their drawbacks is the volume of data generated by time-domain acquisitions made across the scanning grid. Moreover, there are a multiplicity of sources of systematic errors that can pass unnoticed in measurements and that could compromise the accuracy of the data used for post-processing. This paper presents a pre-evaluation procedure that follows an exploratory data analysis approach for detecting such errors using an objective statistical criterion when applied to stochastic emissions of near-field scanning measurement data. Results are presented using real measurement data from the scanning of an Arduino Intel Galileo board, as has been reported in previous studies. By performing the proposed analysis, significant errors were detected in the measurement data. Final remarks on the importance of performing quality clearance in the measurement data from stochastic emissions assessments are provided.

AB - Recently, near-field scanning techniques for measuring and analysing stochastic emissions have been theoretically and experimentally studied and they are promising in terms of the characterization and classification radiated emissions in densely integrated technologies. Nonetheless, one of their drawbacks is the volume of data generated by time-domain acquisitions made across the scanning grid. Moreover, there are a multiplicity of sources of systematic errors that can pass unnoticed in measurements and that could compromise the accuracy of the data used for post-processing. This paper presents a pre-evaluation procedure that follows an exploratory data analysis approach for detecting such errors using an objective statistical criterion when applied to stochastic emissions of near-field scanning measurement data. Results are presented using real measurement data from the scanning of an Arduino Intel Galileo board, as has been reported in previous studies. By performing the proposed analysis, significant errors were detected in the measurement data. Final remarks on the importance of performing quality clearance in the measurement data from stochastic emissions assessments are provided.

KW - Near-field scanning

KW - radiated emissions

KW - stochastic fields

KW - time-domain measurements

UR - http://www.scopus.com/inward/record.url?scp=85056088891&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85056088891&partnerID=8YFLogxK

U2 - 10.1109/EMCEurope.2018.8485066

DO - 10.1109/EMCEurope.2018.8485066

M3 - Conference contribution

VL - 2018-August

SP - 567

EP - 572

BT - EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility

PB - Institute of Electrical and Electronics Engineers Inc.

ER -