Enhanced near IR absorption in random, RIE-textured silicon solar cells: The role of surface profiles

Saleem H. Zaidi, Douglas S. Ruby, Karen DeZetter, James M. Gee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

We report on the role of surface profiles exhibiting comparable reflectance in random reactive ion etched textured Si solar cells. Internal quantum efficiency measurements demonstrate significant near IR absorption enhancement with peaks at λ ∼ 1120 nm and 1050 nm. Using Fourier analysis of random surfaces, we find a majority of spatial structures in ∼ 0.3-5-μm range. This random distribution of subwavelength periodic structures leads to enhanced oblique coupling into Si through diffractive optics mechanisms. The random surfaces supporting finer features create diffraction orders propagating at larger angles enhancing near IR absorption through oblique light propagation. Random surfaces with larger features create almost vertically propagating diffraction orders resulting in little oblique coupling, and for some structures, almost no enhanced near IR absorption.

Original languageEnglish
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Pages142-145
Number of pages4
Publication statusPublished - 2002
Externally publishedYes
Event29th IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States
Duration: 19 May 200224 May 2002

Other

Other29th IEEE Photovoltaic Specialists Conference
CountryUnited States
CityNew Orleans, LA
Period19/5/0224/5/02

Fingerprint

Silicon solar cells
Reactive ion etching
solar cells
profiles
Diffraction
Diffractive optics
diffractive optics
Light propagation
Fourier analysis
Periodic structures
statistical distributions
Quantum efficiency
diffraction
quantum efficiency
Solar cells
reflectance
propagation
augmentation
Ions
ions

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Condensed Matter Physics

Cite this

Zaidi, S. H., Ruby, D. S., DeZetter, K., & Gee, J. M. (2002). Enhanced near IR absorption in random, RIE-textured silicon solar cells: The role of surface profiles. In Conference Record of the IEEE Photovoltaic Specialists Conference (pp. 142-145)

Enhanced near IR absorption in random, RIE-textured silicon solar cells : The role of surface profiles. / Zaidi, Saleem H.; Ruby, Douglas S.; DeZetter, Karen; Gee, James M.

Conference Record of the IEEE Photovoltaic Specialists Conference. 2002. p. 142-145.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zaidi, SH, Ruby, DS, DeZetter, K & Gee, JM 2002, Enhanced near IR absorption in random, RIE-textured silicon solar cells: The role of surface profiles. in Conference Record of the IEEE Photovoltaic Specialists Conference. pp. 142-145, 29th IEEE Photovoltaic Specialists Conference, New Orleans, LA, United States, 19/5/02.
Zaidi SH, Ruby DS, DeZetter K, Gee JM. Enhanced near IR absorption in random, RIE-textured silicon solar cells: The role of surface profiles. In Conference Record of the IEEE Photovoltaic Specialists Conference. 2002. p. 142-145
Zaidi, Saleem H. ; Ruby, Douglas S. ; DeZetter, Karen ; Gee, James M. / Enhanced near IR absorption in random, RIE-textured silicon solar cells : The role of surface profiles. Conference Record of the IEEE Photovoltaic Specialists Conference. 2002. pp. 142-145
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