Electrical characterization of interdigital electrode based on cyclic voltammetry performances

Hafzaliza Erny Zainal Abidin, Azrul Azlan Hamzah, Burhanuddin Yeop Majlis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Cyclic voltammetry is a common characterization technique for electrochemical reactions of electroactive species. Cyclic voltammetry is an important characteristic to determine the performances of energy storage devices such as battery and supercapacitor. In this paper we focus on the interdigital electrode with the various physical parameters such as gap, width and length of electrodes to increase the current response based on cyclic voltammetry performances. 2-D cyclic voltammetry time dependent model was developed. The interdigital electrode array consists of working electrode and counter electrode and the reaction at the working electrode is described by concentration dependent Butler-Volmer kinetics. The counter electrode is modeled so that it acts like an ideal reference electrode. In the design, the counter electrode with respect to ground is set to zero. The applied cell potential range from -0.5V to 0.5V. To explore the performances on cyclic voltammetry with different physical parameters of interdigital electrode, Comsol Multiphysics ver.4.2a is used to design the interdigital electrode, and the cyclic voltammetry was plotted. The maximum current response achieved is 1.6 A/m corresponding to gap of electrodes of 250 um. For the width and length of the electrodes, the maximum current response is 0.85 A/m and 1.6 A/m respectively corresponding the width of electrodes of 50 um and the length of electrodes of 700 um.

Original languageEnglish
Title of host publication2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings
Pages348-351
Number of pages4
DOIs
Publication statusPublished - 2012
Event2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Kuala Lumpur
Duration: 19 Sep 201221 Sep 2012

Other

Other2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012
CityKuala Lumpur
Period19/9/1221/9/12

Fingerprint

Cyclic voltammetry
Electrodes
Energy storage

Keywords

  • Counter Electrode
  • Cyclic Voltammetry
  • Interdigital structure
  • Working Electrode

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Abidin, H. E. Z., Hamzah, A. A., & Yeop Majlis, B. (2012). Electrical characterization of interdigital electrode based on cyclic voltammetry performances. In 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings (pp. 348-351). [6417157] https://doi.org/10.1109/SMElec.2012.6417157

Electrical characterization of interdigital electrode based on cyclic voltammetry performances. / Abidin, Hafzaliza Erny Zainal; Hamzah, Azrul Azlan; Yeop Majlis, Burhanuddin.

2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. 2012. p. 348-351 6417157.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abidin, HEZ, Hamzah, AA & Yeop Majlis, B 2012, Electrical characterization of interdigital electrode based on cyclic voltammetry performances. in 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings., 6417157, pp. 348-351, 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012, Kuala Lumpur, 19/9/12. https://doi.org/10.1109/SMElec.2012.6417157
Abidin HEZ, Hamzah AA, Yeop Majlis B. Electrical characterization of interdigital electrode based on cyclic voltammetry performances. In 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. 2012. p. 348-351. 6417157 https://doi.org/10.1109/SMElec.2012.6417157
Abidin, Hafzaliza Erny Zainal ; Hamzah, Azrul Azlan ; Yeop Majlis, Burhanuddin. / Electrical characterization of interdigital electrode based on cyclic voltammetry performances. 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. 2012. pp. 348-351
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