Electrical and microstructural properties of (La1-x Prx)1/2Ba1/2MnO3 compounds

Huda Abdullah, S. A. Halim

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The electrical and microstructural properties of (La1-xPrx)1/2Ba1/2 MnO3 (x = 0.000, 0.167, 0.333, 0.500, 0.677, 0.833 and 1.000) compounds, prepared by the solid state reaction, have been investigated. The electrical property has been determined by using standard four-point probe resistivity measurement with a temperature range of 30 K to 300 K. By increasing the Pr doping, the metal-insulator transition temperature (Tp) shifted to lower temperatures, which are 254, 248, 228, 220, 196, 180 and 158K for x = 0.000, 0.167, 0.333, 0.500, 0.677, 0.833 and 1.000, respectively. Using several theoretical models, it has been concluded that the metallic (ferromagnetic) part of the resistivity (p) (below Tp) fits well with the equation p = p0 + p2.5T2.5, indicating that p0 is due to the importance of grain and domain boundary effects, a second term ∼ p2.5T2.5 appears that might be attributed to electron-electron scattering. The scanning electron microscope (SEM) micrographs show the grains size decreases as the level of porosity increases, which contributes to the increase in resistivity.

Original languageEnglish
Pages (from-to)209-213
Number of pages5
JournalSains Malaysiana
Volume38
Issue number2
Publication statusPublished - Apr 2009

Fingerprint

electrical properties
electrical resistivity
electron scattering
grain boundaries
electron microscopes
grain size
transition temperature
insulators
solid state
porosity
scanning
temperature
probes
metals
electrons

Keywords

  • Metal-insulator transition
  • Resistivity
  • Transition temperature

ASJC Scopus subject areas

  • General

Cite this

Electrical and microstructural properties of (La1-x Prx)1/2Ba1/2MnO3 compounds. / Abdullah, Huda; Halim, S. A.

In: Sains Malaysiana, Vol. 38, No. 2, 04.2009, p. 209-213.

Research output: Contribution to journalArticle

@article{f16bb2acdef345dc8fbcd7984d289360,
title = "Electrical and microstructural properties of (La1-x Prx)1/2Ba1/2MnO3 compounds",
abstract = "The electrical and microstructural properties of (La1-xPrx)1/2Ba1/2 MnO3 (x = 0.000, 0.167, 0.333, 0.500, 0.677, 0.833 and 1.000) compounds, prepared by the solid state reaction, have been investigated. The electrical property has been determined by using standard four-point probe resistivity measurement with a temperature range of 30 K to 300 K. By increasing the Pr doping, the metal-insulator transition temperature (Tp) shifted to lower temperatures, which are 254, 248, 228, 220, 196, 180 and 158K for x = 0.000, 0.167, 0.333, 0.500, 0.677, 0.833 and 1.000, respectively. Using several theoretical models, it has been concluded that the metallic (ferromagnetic) part of the resistivity (p) (below Tp) fits well with the equation p = p0 + p2.5T2.5, indicating that p0 is due to the importance of grain and domain boundary effects, a second term ∼ p2.5T2.5 appears that might be attributed to electron-electron scattering. The scanning electron microscope (SEM) micrographs show the grains size decreases as the level of porosity increases, which contributes to the increase in resistivity.",
keywords = "Metal-insulator transition, Resistivity, Transition temperature",
author = "Huda Abdullah and Halim, {S. A.}",
year = "2009",
month = "4",
language = "English",
volume = "38",
pages = "209--213",
journal = "Sains Malaysiana",
issn = "0126-6039",
publisher = "Penerbit Universiti Kebangsaan Malaysia",
number = "2",

}

TY - JOUR

T1 - Electrical and microstructural properties of (La1-x Prx)1/2Ba1/2MnO3 compounds

AU - Abdullah, Huda

AU - Halim, S. A.

PY - 2009/4

Y1 - 2009/4

N2 - The electrical and microstructural properties of (La1-xPrx)1/2Ba1/2 MnO3 (x = 0.000, 0.167, 0.333, 0.500, 0.677, 0.833 and 1.000) compounds, prepared by the solid state reaction, have been investigated. The electrical property has been determined by using standard four-point probe resistivity measurement with a temperature range of 30 K to 300 K. By increasing the Pr doping, the metal-insulator transition temperature (Tp) shifted to lower temperatures, which are 254, 248, 228, 220, 196, 180 and 158K for x = 0.000, 0.167, 0.333, 0.500, 0.677, 0.833 and 1.000, respectively. Using several theoretical models, it has been concluded that the metallic (ferromagnetic) part of the resistivity (p) (below Tp) fits well with the equation p = p0 + p2.5T2.5, indicating that p0 is due to the importance of grain and domain boundary effects, a second term ∼ p2.5T2.5 appears that might be attributed to electron-electron scattering. The scanning electron microscope (SEM) micrographs show the grains size decreases as the level of porosity increases, which contributes to the increase in resistivity.

AB - The electrical and microstructural properties of (La1-xPrx)1/2Ba1/2 MnO3 (x = 0.000, 0.167, 0.333, 0.500, 0.677, 0.833 and 1.000) compounds, prepared by the solid state reaction, have been investigated. The electrical property has been determined by using standard four-point probe resistivity measurement with a temperature range of 30 K to 300 K. By increasing the Pr doping, the metal-insulator transition temperature (Tp) shifted to lower temperatures, which are 254, 248, 228, 220, 196, 180 and 158K for x = 0.000, 0.167, 0.333, 0.500, 0.677, 0.833 and 1.000, respectively. Using several theoretical models, it has been concluded that the metallic (ferromagnetic) part of the resistivity (p) (below Tp) fits well with the equation p = p0 + p2.5T2.5, indicating that p0 is due to the importance of grain and domain boundary effects, a second term ∼ p2.5T2.5 appears that might be attributed to electron-electron scattering. The scanning electron microscope (SEM) micrographs show the grains size decreases as the level of porosity increases, which contributes to the increase in resistivity.

KW - Metal-insulator transition

KW - Resistivity

KW - Transition temperature

UR - http://www.scopus.com/inward/record.url?scp=65449138427&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=65449138427&partnerID=8YFLogxK

M3 - Article

VL - 38

SP - 209

EP - 213

JO - Sains Malaysiana

JF - Sains Malaysiana

SN - 0126-6039

IS - 2

ER -