Effects on crystal structure of CZTS thin films owing to deionized water and sulfurization treatment

Samia Ahmed Nadi, Puvaneswaran Chelvanathan, Yulisa Yusoff, M. A. Islam, Nowshad Amin, Kamaruzzaman Sopian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To condense the cost and increase the production, using abundantly obtainable non-toxic elements, Cu2ZnSnS4 (CZTS) seem to be a strong contender among the photovoltaic thin film technologies. Cu2ZnSnS4 thin films were fabricated by RF magnetron sputtering system. CZTS were sputtered on Molybdenum (Mo) coated soda lime glass (SLG) using a single target sputtering technique. The sputtering parameters (base pressure, working pressure, Argon (Ar) flow rate, RF power and sputtering time) were kept same for all three types of films. For sulfurization, the temperature used was 500 °C. Finally, As-deposited film was immersed in DIW before undergoing identical sulfurization profile. As-deposited film (Sample A), sulfurized films (Sample B) and sulfurized plus DIW treated (Sample C) were compared in terms of their structural properties by means of X-Ray Diffraction (XRD) measurement and Atomic Force Microscopy (AFM). Sample B and C showed peak of (1 1 2) planes of CZTS which are characteristics of stannite structure. Post deposition treatment on CZTS films proved to be beneficial as evident from the observed enhancement in the crystallinity and grain growth. Significant difference on grain size and area roughness could be observed from the AFM measurement. The roughness of Sample A, B and C increased from 5.007 nm to 20.509 nm and 14.183 nm accordingly. From XRD data secondary phases of CuxMoSx could be observed.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
PublisherAmerican Institute of Physics Inc.
Volume1660
ISBN (Print)9780735413047
DOIs
Publication statusPublished - 15 May 2015
EventInternational Conference on Mathematics, Engineering and Industrial Applications, ICoMEIA 2014 - Penang, Malaysia
Duration: 28 May 201430 May 2014

Other

OtherInternational Conference on Mathematics, Engineering and Industrial Applications, ICoMEIA 2014
CountryMalaysia
CityPenang
Period28/5/1430/5/14

Fingerprint

water treatment
crystal structure
thin films
sputtering
roughness
atomic force microscopy
base pressure
calcium oxides
diffraction
molybdenum
crystallinity
magnetron sputtering
x rays
flow velocity
grain size
argon
costs
augmentation
glass
profiles

Keywords

  • CuZnSnS (CZTS)
  • DIW treatment
  • sulfurization treatment

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Nadi, S. A., Chelvanathan, P., Yusoff, Y., Islam, M. A., Amin, N., & Sopian, K. (2015). Effects on crystal structure of CZTS thin films owing to deionized water and sulfurization treatment. In AIP Conference Proceedings (Vol. 1660). [070060] American Institute of Physics Inc.. https://doi.org/10.1063/1.4915778

Effects on crystal structure of CZTS thin films owing to deionized water and sulfurization treatment. / Nadi, Samia Ahmed; Chelvanathan, Puvaneswaran; Yusoff, Yulisa; Islam, M. A.; Amin, Nowshad; Sopian, Kamaruzzaman.

AIP Conference Proceedings. Vol. 1660 American Institute of Physics Inc., 2015. 070060.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nadi, SA, Chelvanathan, P, Yusoff, Y, Islam, MA, Amin, N & Sopian, K 2015, Effects on crystal structure of CZTS thin films owing to deionized water and sulfurization treatment. in AIP Conference Proceedings. vol. 1660, 070060, American Institute of Physics Inc., International Conference on Mathematics, Engineering and Industrial Applications, ICoMEIA 2014, Penang, Malaysia, 28/5/14. https://doi.org/10.1063/1.4915778
Nadi SA, Chelvanathan P, Yusoff Y, Islam MA, Amin N, Sopian K. Effects on crystal structure of CZTS thin films owing to deionized water and sulfurization treatment. In AIP Conference Proceedings. Vol. 1660. American Institute of Physics Inc. 2015. 070060 https://doi.org/10.1063/1.4915778
Nadi, Samia Ahmed ; Chelvanathan, Puvaneswaran ; Yusoff, Yulisa ; Islam, M. A. ; Amin, Nowshad ; Sopian, Kamaruzzaman. / Effects on crystal structure of CZTS thin films owing to deionized water and sulfurization treatment. AIP Conference Proceedings. Vol. 1660 American Institute of Physics Inc., 2015.
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N2 - To condense the cost and increase the production, using abundantly obtainable non-toxic elements, Cu2ZnSnS4 (CZTS) seem to be a strong contender among the photovoltaic thin film technologies. Cu2ZnSnS4 thin films were fabricated by RF magnetron sputtering system. CZTS were sputtered on Molybdenum (Mo) coated soda lime glass (SLG) using a single target sputtering technique. The sputtering parameters (base pressure, working pressure, Argon (Ar) flow rate, RF power and sputtering time) were kept same for all three types of films. For sulfurization, the temperature used was 500 °C. Finally, As-deposited film was immersed in DIW before undergoing identical sulfurization profile. As-deposited film (Sample A), sulfurized films (Sample B) and sulfurized plus DIW treated (Sample C) were compared in terms of their structural properties by means of X-Ray Diffraction (XRD) measurement and Atomic Force Microscopy (AFM). Sample B and C showed peak of (1 1 2) planes of CZTS which are characteristics of stannite structure. Post deposition treatment on CZTS films proved to be beneficial as evident from the observed enhancement in the crystallinity and grain growth. Significant difference on grain size and area roughness could be observed from the AFM measurement. The roughness of Sample A, B and C increased from 5.007 nm to 20.509 nm and 14.183 nm accordingly. From XRD data secondary phases of CuxMoSx could be observed.

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