Effects of sulfurization temperature on Cu<inf>2</inf>ZnSnS<inf>4</inf> thin film deposited by single source thermal evaporation method

Zaihasraf Zakaria, Puvaneswaran Chelvanathan, Mohammad Junaebur Rashid, Md. Akhtaruzzaman, Mohammad Mezbaul Alam, Zeid Abdullah Al-Othman, Abdulrahman Alamoud, Kamaruzzaman Sopian, Nowshad Amin

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Abstract

In this study, the effects of sulfurization temperature on the properties of thermally evaporated Cu<inf>2</inf>ZnSnS<inf>4</inf> (CZTS) thin films were investigated. Molybdenum (Mo) coated soda lime glass (SLG) was used as substrates and stoichiometric CZTS powder (99.95-) was used as the source material. XRD patterns showed that CZTS were formed with preferential orientations of (112) > (220) > (312) for all the investigated films. The intensity of (112) peak is found increasing until a certain temperature indicating that the highest degree of crystallinity is achieved together with secondary phases such as ZnS and SnS. It was confirmed by raman shift at 338cm-1 from Raman spectroscopy, scanning electron microscopy (SEM) and atomic force microscopy (AFM) results showed a trend for surface roughness as well as morphology. From Hall effect measurement, all deposited films exhibited p-type conductivity. From UV-vis spectroscopy measurement, the optical band gap of all the films are found in the range of potential absorbers for CZTS based thin film solar cells.

Original languageEnglish
Article number08KC18
JournalJapanese Journal of Applied Physics
Volume54
Issue number8
DOIs
Publication statusPublished - 1 Aug 2015

Fingerprint

Thermal evaporation
evaporation
Thin films
thin films
Optical band gaps
Hall effect
calcium oxides
Ultraviolet spectroscopy
Lime
Temperature
Molybdenum
molybdenum
temperature
Raman spectroscopy
Atomic force microscopy
crystallinity
absorbers
surface roughness
solar cells
Surface roughness

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Effects of sulfurization temperature on Cu<inf>2</inf>ZnSnS<inf>4</inf> thin film deposited by single source thermal evaporation method. / Zakaria, Zaihasraf; Chelvanathan, Puvaneswaran; Rashid, Mohammad Junaebur; Akhtaruzzaman, Md.; Alam, Mohammad Mezbaul; Al-Othman, Zeid Abdullah; Alamoud, Abdulrahman; Sopian, Kamaruzzaman; Amin, Nowshad.

In: Japanese Journal of Applied Physics, Vol. 54, No. 8, 08KC18, 01.08.2015.

Research output: Contribution to journalArticle

Zakaria, Zaihasraf ; Chelvanathan, Puvaneswaran ; Rashid, Mohammad Junaebur ; Akhtaruzzaman, Md. ; Alam, Mohammad Mezbaul ; Al-Othman, Zeid Abdullah ; Alamoud, Abdulrahman ; Sopian, Kamaruzzaman ; Amin, Nowshad. / Effects of sulfurization temperature on Cu<inf>2</inf>ZnSnS<inf>4</inf> thin film deposited by single source thermal evaporation method. In: Japanese Journal of Applied Physics. 2015 ; Vol. 54, No. 8.
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