Effect of Zn site for Ca substitution on optical and microwave dielectric properties of ZnAl2O4 thin films by sol gel method

Wan Nasarudin Wan Jalal, Huda Abdullah, Mohd Syafiq Zulfakar

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Ca x Zn (1 - x) Al 2 O 4 (x = 0.00, 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) thin films were prepared by a sol gel method. The XRD patterns displayed the characteristic peaks of (Ca/Zn)Al2O4 with the standard pattern of face-centred cubic (fcc). The addition of Ca decreased the lattice constant from 14.6 nm to 23.2 nm. The optical bandgap of undoped thin film was found to be at 3.84 eV while for doped Ca was observed at 3.50 to 3.73 eV. The substitution of Zn2+ by Ca2+ in ZnAl2O 4 thin films was found to increase the crystallite size, grain size, and surface morphology which evidently affect the density and dielectric constant. The Ca x Zn 1 - x Al 2 O 4 thin films were characterized at 20 to 1 MHZ frequency to determine the dielectric constant ε r and unloaded quality factor Q u using LCR spectrometer. It can be observed that specimen using Ca0.25Zn0.75Al2O4 possesses ε r 10.41 and Q u 5770 which is suggested as a candidate material for millimetre-wave applications. Therefore, this ceramic is suggested as a candidate material for GPS patch antennas.

Original languageEnglish
Article number619024
JournalAdvances in Materials Science and Engineering
Volume2014
DOIs
Publication statusPublished - 2014

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Dielectric properties
Sol-gel process
Substitution reactions
Microwaves
Thin films
Permittivity
Optical band gaps
Crystallite size
Microstrip antennas
Millimeter waves
Lattice constants
Surface morphology
Spectrometers
Global positioning system

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

Cite this

Effect of Zn site for Ca substitution on optical and microwave dielectric properties of ZnAl2O4 thin films by sol gel method. / Wan Jalal, Wan Nasarudin; Abdullah, Huda; Zulfakar, Mohd Syafiq.

In: Advances in Materials Science and Engineering, Vol. 2014, 619024, 2014.

Research output: Contribution to journalArticle

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PY - 2014

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AB - Ca x Zn (1 - x) Al 2 O 4 (x = 0.00, 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) thin films were prepared by a sol gel method. The XRD patterns displayed the characteristic peaks of (Ca/Zn)Al2O4 with the standard pattern of face-centred cubic (fcc). The addition of Ca decreased the lattice constant from 14.6 nm to 23.2 nm. The optical bandgap of undoped thin film was found to be at 3.84 eV while for doped Ca was observed at 3.50 to 3.73 eV. The substitution of Zn2+ by Ca2+ in ZnAl2O 4 thin films was found to increase the crystallite size, grain size, and surface morphology which evidently affect the density and dielectric constant. The Ca x Zn 1 - x Al 2 O 4 thin films were characterized at 20 to 1 MHZ frequency to determine the dielectric constant ε r and unloaded quality factor Q u using LCR spectrometer. It can be observed that specimen using Ca0.25Zn0.75Al2O4 possesses ε r 10.41 and Q u 5770 which is suggested as a candidate material for millimetre-wave applications. Therefore, this ceramic is suggested as a candidate material for GPS patch antennas.

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