Abstract
Ca x Zn (1 - x) Al 2 O 4 (x = 0.00, 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) thin films were prepared by a sol gel method. The XRD patterns displayed the characteristic peaks of (Ca/Zn)Al2O4 with the standard pattern of face-centred cubic (fcc). The addition of Ca decreased the lattice constant from 14.6 nm to 23.2 nm. The optical bandgap of undoped thin film was found to be at 3.84 eV while for doped Ca was observed at 3.50 to 3.73 eV. The substitution of Zn2+ by Ca2+ in ZnAl2O 4 thin films was found to increase the crystallite size, grain size, and surface morphology which evidently affect the density and dielectric constant. The Ca x Zn 1 - x Al 2 O 4 thin films were characterized at 20 to 1 MHZ frequency to determine the dielectric constant ε r and unloaded quality factor Q u using LCR spectrometer. It can be observed that specimen using Ca0.25Zn0.75Al2O4 possesses ε r 10.41 and Q u 5770 which is suggested as a candidate material for millimetre-wave applications. Therefore, this ceramic is suggested as a candidate material for GPS patch antennas.
| Original language | English |
|---|---|
| Article number | 619024 |
| Journal | Advances in Materials Science and Engineering |
| Volume | 2014 |
| DOIs | |
| Publication status | Published - 2014 |
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ASJC Scopus subject areas
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- Engineering(all)
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Effect of Zn site for Ca substitution on optical and microwave dielectric properties of ZnAl2O4 thin films by sol gel method. / Wan Jalal, Wan Nasarudin; Abdullah, Huda; Zulfakar, Mohd Syafiq.
In: Advances in Materials Science and Engineering, Vol. 2014, 619024, 2014.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Effect of Zn site for Ca substitution on optical and microwave dielectric properties of ZnAl2O4 thin films by sol gel method
AU - Wan Jalal, Wan Nasarudin
AU - Abdullah, Huda
AU - Zulfakar, Mohd Syafiq
PY - 2014
Y1 - 2014
N2 - Ca x Zn (1 - x) Al 2 O 4 (x = 0.00, 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) thin films were prepared by a sol gel method. The XRD patterns displayed the characteristic peaks of (Ca/Zn)Al2O4 with the standard pattern of face-centred cubic (fcc). The addition of Ca decreased the lattice constant from 14.6 nm to 23.2 nm. The optical bandgap of undoped thin film was found to be at 3.84 eV while for doped Ca was observed at 3.50 to 3.73 eV. The substitution of Zn2+ by Ca2+ in ZnAl2O 4 thin films was found to increase the crystallite size, grain size, and surface morphology which evidently affect the density and dielectric constant. The Ca x Zn 1 - x Al 2 O 4 thin films were characterized at 20 to 1 MHZ frequency to determine the dielectric constant ε r and unloaded quality factor Q u using LCR spectrometer. It can be observed that specimen using Ca0.25Zn0.75Al2O4 possesses ε r 10.41 and Q u 5770 which is suggested as a candidate material for millimetre-wave applications. Therefore, this ceramic is suggested as a candidate material for GPS patch antennas.
AB - Ca x Zn (1 - x) Al 2 O 4 (x = 0.00, 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) thin films were prepared by a sol gel method. The XRD patterns displayed the characteristic peaks of (Ca/Zn)Al2O4 with the standard pattern of face-centred cubic (fcc). The addition of Ca decreased the lattice constant from 14.6 nm to 23.2 nm. The optical bandgap of undoped thin film was found to be at 3.84 eV while for doped Ca was observed at 3.50 to 3.73 eV. The substitution of Zn2+ by Ca2+ in ZnAl2O 4 thin films was found to increase the crystallite size, grain size, and surface morphology which evidently affect the density and dielectric constant. The Ca x Zn 1 - x Al 2 O 4 thin films were characterized at 20 to 1 MHZ frequency to determine the dielectric constant ε r and unloaded quality factor Q u using LCR spectrometer. It can be observed that specimen using Ca0.25Zn0.75Al2O4 possesses ε r 10.41 and Q u 5770 which is suggested as a candidate material for millimetre-wave applications. Therefore, this ceramic is suggested as a candidate material for GPS patch antennas.
UR - http://www.scopus.com/inward/record.url?scp=84894710330&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84894710330&partnerID=8YFLogxK
U2 - 10.1155/2014/619024
DO - 10.1155/2014/619024
M3 - Article
AN - SCOPUS:84894710330
VL - 2014
JO - Advances in Materials Science and Engineering
JF - Advances in Materials Science and Engineering
SN - 1687-8434
M1 - 619024
ER -