Effect of substrate temperature on the growth of CZTS thin films by RF magnetron sputtering

S. A. Nadi, P. Chelvanathan, M. M. Alam, Md. Akhtaruzzaman, Kamaruzzaman Sopian, A. S M Mukter Uzzaman, Nowshad Amin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Cu2ZnSnS4 thin films have been deposited using a single target sputtering technique. Molybdenum coated soda lime glass has been used as substrates. The effects of substrate temperature variation are the main motive of this work. Growth temperature ranging from 300 °C to 450 °C was used as different substrate temperature whereas all other sputtering parameters remained same. A comparative study of electrical, optical and structural properties of these films was carried out by means of Hall, XRD, AFM and UV-Vis spectrometry. From the Atomic Force Microscopy (AFM), it was witnessed that until the substrate temperature was raised to 370 °C the grain size of the films were increasing. But at 400 °C and 450 °C substrate temperature the grain size started decreasing. For all the films, X-Ray Diffraction measurement (XRD) showed the peaks of (2 2 0) and (1 1 2) planes of CZTS which are characteristics of stannite structure. To check the conductivity type of the films, Hall Effect Measurement System was used and it ensued p-type.

Original languageEnglish
Title of host publicationCEAT 2013 - 2013 IEEE Conference on Clean Energy and Technology
PublisherIEEE Computer Society
Pages466-468
Number of pages3
DOIs
Publication statusPublished - 2013
Event2013 IEEE Conference on Clean Energy and Technology, CEAT 2013 - Langkawi
Duration: 18 Nov 201320 Nov 2013

Other

Other2013 IEEE Conference on Clean Energy and Technology, CEAT 2013
CityLangkawi
Period18/11/1320/11/13

Fingerprint

Magnetron sputtering
Thin films
Substrates
Sputtering
Atomic force microscopy
Temperature
X ray diffraction
Hall effect
Growth temperature
Lime
Spectrometry
Molybdenum
Structural properties
Electric properties
Optical properties
Glass

Keywords

  • Cu2ZnSnS4;Magnetron sputtering
  • Growth temperature
  • Thin films

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Fuel Technology

Cite this

Nadi, S. A., Chelvanathan, P., Alam, M. M., Akhtaruzzaman, M., Sopian, K., Mukter Uzzaman, A. S. M., & Amin, N. (2013). Effect of substrate temperature on the growth of CZTS thin films by RF magnetron sputtering. In CEAT 2013 - 2013 IEEE Conference on Clean Energy and Technology (pp. 466-468). [6775677] IEEE Computer Society. https://doi.org/10.1109/CEAT.2013.6775677

Effect of substrate temperature on the growth of CZTS thin films by RF magnetron sputtering. / Nadi, S. A.; Chelvanathan, P.; Alam, M. M.; Akhtaruzzaman, Md.; Sopian, Kamaruzzaman; Mukter Uzzaman, A. S M; Amin, Nowshad.

CEAT 2013 - 2013 IEEE Conference on Clean Energy and Technology. IEEE Computer Society, 2013. p. 466-468 6775677.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nadi, SA, Chelvanathan, P, Alam, MM, Akhtaruzzaman, M, Sopian, K, Mukter Uzzaman, ASM & Amin, N 2013, Effect of substrate temperature on the growth of CZTS thin films by RF magnetron sputtering. in CEAT 2013 - 2013 IEEE Conference on Clean Energy and Technology., 6775677, IEEE Computer Society, pp. 466-468, 2013 IEEE Conference on Clean Energy and Technology, CEAT 2013, Langkawi, 18/11/13. https://doi.org/10.1109/CEAT.2013.6775677
Nadi SA, Chelvanathan P, Alam MM, Akhtaruzzaman M, Sopian K, Mukter Uzzaman ASM et al. Effect of substrate temperature on the growth of CZTS thin films by RF magnetron sputtering. In CEAT 2013 - 2013 IEEE Conference on Clean Energy and Technology. IEEE Computer Society. 2013. p. 466-468. 6775677 https://doi.org/10.1109/CEAT.2013.6775677
Nadi, S. A. ; Chelvanathan, P. ; Alam, M. M. ; Akhtaruzzaman, Md. ; Sopian, Kamaruzzaman ; Mukter Uzzaman, A. S M ; Amin, Nowshad. / Effect of substrate temperature on the growth of CZTS thin films by RF magnetron sputtering. CEAT 2013 - 2013 IEEE Conference on Clean Energy and Technology. IEEE Computer Society, 2013. pp. 466-468
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AB - Cu2ZnSnS4 thin films have been deposited using a single target sputtering technique. Molybdenum coated soda lime glass has been used as substrates. The effects of substrate temperature variation are the main motive of this work. Growth temperature ranging from 300 °C to 450 °C was used as different substrate temperature whereas all other sputtering parameters remained same. A comparative study of electrical, optical and structural properties of these films was carried out by means of Hall, XRD, AFM and UV-Vis spectrometry. From the Atomic Force Microscopy (AFM), it was witnessed that until the substrate temperature was raised to 370 °C the grain size of the films were increasing. But at 400 °C and 450 °C substrate temperature the grain size started decreasing. For all the films, X-Ray Diffraction measurement (XRD) showed the peaks of (2 2 0) and (1 1 2) planes of CZTS which are characteristics of stannite structure. To check the conductivity type of the films, Hall Effect Measurement System was used and it ensued p-type.

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