Effect of CdCl<inf>2</inf> treatment on thermally evaporated CdTe thin films

K. S. Rahman, F. Haque, N. A. Khan, M. A. Islam, M. M. Alam, Z. A. Alothman, Kamaruzzaman Sopian, Nowshad Amin

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The influence of CdCl<inf>2</inf> treatment on the properties of thermally evaporated CdTe thin film was investigated in this analysis to achieve high quality thin films. Thin films of CdTe were deposited on cleaned soda lime glass substrates at room temperature by thermal evaporation technique. Then the samples were treated by CdCl<inf>2</inf> and subsequently annealed at annealing temperature of 400ºC for 15 minutes. The structural, optical and electrical properties of the grown samples were investigated through XRD, AFM, UV-Vis spectrometry and Hall-effect measurement analysis. The as-deposited films prepared at 25A were found in polycrystalline form, whereas the films prepared at deposition current of 28A and 30A exhibit cubic crystallinity with (111) preferential orientation around 2θ=23.8º. The crystallinity and the carrier concentration of the films were improved for all the CdCl<inf>2</inf> treated films. The surface roughness of the films was also highly affected by the CdCl<inf>2</inf> treatment as it was observed from AFM images. The bandgap has been found around 1.43 eV for the as-deposited films whereas the bandgap decreased to 1.4 eV after CdCl<inf>2</inf> treatment. The values of mobility, resistivity and Hall coefficient were observed to decrease after the CdCl<inf>2</inf>treatment.

Original languageEnglish
Pages (from-to)129-139
Number of pages11
JournalChalcogenide Letters
Volume11
Issue number3
Publication statusPublished - 2014

Fingerprint

Cadmium Chloride
Thin films
thin films
Hall effect
crystallinity
Energy gap
atomic force microscopy
Thermal evaporation
calcium oxides
coefficients
Lime
Spectrometry
Carrier concentration
Structural properties
surface roughness
Electric properties
Optical properties
Surface roughness
electrical properties
evaporation

Keywords

  • AFM
  • CdCl<inf>2</inf> treatment
  • CdTe thin film
  • Thermal evaporation
  • XRD

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Physics and Astronomy(all)

Cite this

Rahman, K. S., Haque, F., Khan, N. A., Islam, M. A., Alam, M. M., Alothman, Z. A., ... Amin, N. (2014). Effect of CdCl<inf>2</inf> treatment on thermally evaporated CdTe thin films. Chalcogenide Letters, 11(3), 129-139.

Effect of CdCl<inf>2</inf> treatment on thermally evaporated CdTe thin films. / Rahman, K. S.; Haque, F.; Khan, N. A.; Islam, M. A.; Alam, M. M.; Alothman, Z. A.; Sopian, Kamaruzzaman; Amin, Nowshad.

In: Chalcogenide Letters, Vol. 11, No. 3, 2014, p. 129-139.

Research output: Contribution to journalArticle

Rahman, KS, Haque, F, Khan, NA, Islam, MA, Alam, MM, Alothman, ZA, Sopian, K & Amin, N 2014, 'Effect of CdCl<inf>2</inf> treatment on thermally evaporated CdTe thin films', Chalcogenide Letters, vol. 11, no. 3, pp. 129-139.
Rahman KS, Haque F, Khan NA, Islam MA, Alam MM, Alothman ZA et al. Effect of CdCl<inf>2</inf> treatment on thermally evaporated CdTe thin films. Chalcogenide Letters. 2014;11(3):129-139.
Rahman, K. S. ; Haque, F. ; Khan, N. A. ; Islam, M. A. ; Alam, M. M. ; Alothman, Z. A. ; Sopian, Kamaruzzaman ; Amin, Nowshad. / Effect of CdCl<inf>2</inf> treatment on thermally evaporated CdTe thin films. In: Chalcogenide Letters. 2014 ; Vol. 11, No. 3. pp. 129-139.
@article{0ee9f93065114b60857b4cd5c5206972,
title = "Effect of CdCl2 treatment on thermally evaporated CdTe thin films",
abstract = "The influence of CdCl2 treatment on the properties of thermally evaporated CdTe thin film was investigated in this analysis to achieve high quality thin films. Thin films of CdTe were deposited on cleaned soda lime glass substrates at room temperature by thermal evaporation technique. Then the samples were treated by CdCl2 and subsequently annealed at annealing temperature of 400ºC for 15 minutes. The structural, optical and electrical properties of the grown samples were investigated through XRD, AFM, UV-Vis spectrometry and Hall-effect measurement analysis. The as-deposited films prepared at 25A were found in polycrystalline form, whereas the films prepared at deposition current of 28A and 30A exhibit cubic crystallinity with (111) preferential orientation around 2θ=23.8º. The crystallinity and the carrier concentration of the films were improved for all the CdCl2 treated films. The surface roughness of the films was also highly affected by the CdCl2 treatment as it was observed from AFM images. The bandgap has been found around 1.43 eV for the as-deposited films whereas the bandgap decreased to 1.4 eV after CdCl2 treatment. The values of mobility, resistivity and Hall coefficient were observed to decrease after the CdCl2treatment.",
keywords = "AFM, CdCl<inf>2</inf> treatment, CdTe thin film, Thermal evaporation, XRD",
author = "Rahman, {K. S.} and F. Haque and Khan, {N. A.} and Islam, {M. A.} and Alam, {M. M.} and Alothman, {Z. A.} and Kamaruzzaman Sopian and Nowshad Amin",
year = "2014",
language = "English",
volume = "11",
pages = "129--139",
journal = "Chalcogenide Letters",
issn = "1584-8663",
publisher = "National Institute R and D of Materials Physics",
number = "3",

}

TY - JOUR

T1 - Effect of CdCl2 treatment on thermally evaporated CdTe thin films

AU - Rahman, K. S.

AU - Haque, F.

AU - Khan, N. A.

AU - Islam, M. A.

AU - Alam, M. M.

AU - Alothman, Z. A.

AU - Sopian, Kamaruzzaman

AU - Amin, Nowshad

PY - 2014

Y1 - 2014

N2 - The influence of CdCl2 treatment on the properties of thermally evaporated CdTe thin film was investigated in this analysis to achieve high quality thin films. Thin films of CdTe were deposited on cleaned soda lime glass substrates at room temperature by thermal evaporation technique. Then the samples were treated by CdCl2 and subsequently annealed at annealing temperature of 400ºC for 15 minutes. The structural, optical and electrical properties of the grown samples were investigated through XRD, AFM, UV-Vis spectrometry and Hall-effect measurement analysis. The as-deposited films prepared at 25A were found in polycrystalline form, whereas the films prepared at deposition current of 28A and 30A exhibit cubic crystallinity with (111) preferential orientation around 2θ=23.8º. The crystallinity and the carrier concentration of the films were improved for all the CdCl2 treated films. The surface roughness of the films was also highly affected by the CdCl2 treatment as it was observed from AFM images. The bandgap has been found around 1.43 eV for the as-deposited films whereas the bandgap decreased to 1.4 eV after CdCl2 treatment. The values of mobility, resistivity and Hall coefficient were observed to decrease after the CdCl2treatment.

AB - The influence of CdCl2 treatment on the properties of thermally evaporated CdTe thin film was investigated in this analysis to achieve high quality thin films. Thin films of CdTe were deposited on cleaned soda lime glass substrates at room temperature by thermal evaporation technique. Then the samples were treated by CdCl2 and subsequently annealed at annealing temperature of 400ºC for 15 minutes. The structural, optical and electrical properties of the grown samples were investigated through XRD, AFM, UV-Vis spectrometry and Hall-effect measurement analysis. The as-deposited films prepared at 25A were found in polycrystalline form, whereas the films prepared at deposition current of 28A and 30A exhibit cubic crystallinity with (111) preferential orientation around 2θ=23.8º. The crystallinity and the carrier concentration of the films were improved for all the CdCl2 treated films. The surface roughness of the films was also highly affected by the CdCl2 treatment as it was observed from AFM images. The bandgap has been found around 1.43 eV for the as-deposited films whereas the bandgap decreased to 1.4 eV after CdCl2 treatment. The values of mobility, resistivity and Hall coefficient were observed to decrease after the CdCl2treatment.

KW - AFM

KW - CdCl<inf>2</inf> treatment

KW - CdTe thin film

KW - Thermal evaporation

KW - XRD

UR - http://www.scopus.com/inward/record.url?scp=84898659651&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84898659651&partnerID=8YFLogxK

M3 - Article

VL - 11

SP - 129

EP - 139

JO - Chalcogenide Letters

JF - Chalcogenide Letters

SN - 1584-8663

IS - 3

ER -