Effect of annealing temperature on the structural and optical properties of nanocrystalline ZnO thin films prepared by sol-gel method

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Abstract

Undoped zinc oxide (ZnO) thin films were prepared by a sol-gel method. The effect of annealing temperature from 500 to 700°C on the structural and optical properties of the films was studied. The films nanostructure characterized by the X-ray diffraction method showed that the films were single phase ZnO with wurtzite structure. The surface morphology studied using the field emission scanning electron microscope showed that the thickness of the films increased with the increment of annealing temperature. The grain size of the films increased with the increment of the annealing temperature. The film surface roughness measured using the atomic force microscope showed that the surface roughness of the film decreased (from 2.3 to 1.02 nm ), when the annealing temperature increased from 500 to 600°C then it increased to 3.06 nm at 700°C. The optical properties were studied by the UV-Vis spectrophotometer. The results showed that the films had high transmittance (above 80%) in the visible range and the exciton absorption occurred at a wavelength of 379 nm. The energy gap decreased with the increment of annealing temperature.

Original languageEnglish
Pages (from-to)1781-1786
Number of pages6
JournalSains Malaysiana
Volume42
Issue number12
Publication statusPublished - Dec 2013

Fingerprint

zinc oxides
gels
optical properties
annealing
thin films
temperature
surface roughness
spectrophotometers
wurtzite
field emission
transmittance
electron microscopes
grain size
microscopes
excitons
scanning
diffraction
wavelengths
x rays

Keywords

  • Annealing
  • Optical
  • Sol-gel
  • XRD
  • ZnO films

ASJC Scopus subject areas

  • General

Cite this

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title = "Effect of annealing temperature on the structural and optical properties of nanocrystalline ZnO thin films prepared by sol-gel method",
abstract = "Undoped zinc oxide (ZnO) thin films were prepared by a sol-gel method. The effect of annealing temperature from 500 to 700°C on the structural and optical properties of the films was studied. The films nanostructure characterized by the X-ray diffraction method showed that the films were single phase ZnO with wurtzite structure. The surface morphology studied using the field emission scanning electron microscope showed that the thickness of the films increased with the increment of annealing temperature. The grain size of the films increased with the increment of the annealing temperature. The film surface roughness measured using the atomic force microscope showed that the surface roughness of the film decreased (from 2.3 to 1.02 nm ), when the annealing temperature increased from 500 to 600°C then it increased to 3.06 nm at 700°C. The optical properties were studied by the UV-Vis spectrophotometer. The results showed that the films had high transmittance (above 80{\%}) in the visible range and the exciton absorption occurred at a wavelength of 379 nm. The energy gap decreased with the increment of annealing temperature.",
keywords = "Annealing, Optical, Sol-gel, XRD, ZnO films",
author = "Ibrahim, {Noor Baa`Yah} and Al-Shomar, {S. M.} and Sahrim Ahmad",
year = "2013",
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language = "English",
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journal = "Sains Malaysiana",
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TY - JOUR

T1 - Effect of annealing temperature on the structural and optical properties of nanocrystalline ZnO thin films prepared by sol-gel method

AU - Ibrahim, Noor Baa`Yah

AU - Al-Shomar, S. M.

AU - Ahmad, Sahrim

PY - 2013/12

Y1 - 2013/12

N2 - Undoped zinc oxide (ZnO) thin films were prepared by a sol-gel method. The effect of annealing temperature from 500 to 700°C on the structural and optical properties of the films was studied. The films nanostructure characterized by the X-ray diffraction method showed that the films were single phase ZnO with wurtzite structure. The surface morphology studied using the field emission scanning electron microscope showed that the thickness of the films increased with the increment of annealing temperature. The grain size of the films increased with the increment of the annealing temperature. The film surface roughness measured using the atomic force microscope showed that the surface roughness of the film decreased (from 2.3 to 1.02 nm ), when the annealing temperature increased from 500 to 600°C then it increased to 3.06 nm at 700°C. The optical properties were studied by the UV-Vis spectrophotometer. The results showed that the films had high transmittance (above 80%) in the visible range and the exciton absorption occurred at a wavelength of 379 nm. The energy gap decreased with the increment of annealing temperature.

AB - Undoped zinc oxide (ZnO) thin films were prepared by a sol-gel method. The effect of annealing temperature from 500 to 700°C on the structural and optical properties of the films was studied. The films nanostructure characterized by the X-ray diffraction method showed that the films were single phase ZnO with wurtzite structure. The surface morphology studied using the field emission scanning electron microscope showed that the thickness of the films increased with the increment of annealing temperature. The grain size of the films increased with the increment of the annealing temperature. The film surface roughness measured using the atomic force microscope showed that the surface roughness of the film decreased (from 2.3 to 1.02 nm ), when the annealing temperature increased from 500 to 600°C then it increased to 3.06 nm at 700°C. The optical properties were studied by the UV-Vis spectrophotometer. The results showed that the films had high transmittance (above 80%) in the visible range and the exciton absorption occurred at a wavelength of 379 nm. The energy gap decreased with the increment of annealing temperature.

KW - Annealing

KW - Optical

KW - Sol-gel

KW - XRD

KW - ZnO films

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