Effect of annealing atmosphere on the morphology of copper oxide thin films deposited on Tio2 substrates prepared by sol-gel process

D. S C Halin, I. A. Talib, A. R. Daud, Muhammad Azmi Abdul Hamid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Copper oxide films were prepared via sol-gel like spin coating starting from methanolic solutions of cupric chloride onto the TiO2 substrates. Films were obtained by spin coating under room conditions (temperature, 25-30 °C) and were subsequently annealed at different temperatures (200- 400 °C) in oxidizing (air) and inert (N2) atmospheres. X-ray diffraction (XRD) patterns showed crystalline phases, which were observed as a function of the annealing conditions. The film composition resulted single or multi-phasic depending on both temperature and atmosphere. The grain size of film was measured using scanning electron microscopy (SEM) and the surface roughness of thin films was characterized by atomic force microscopy (AFM). The grain size of which was annealed in air at 300 °C was 30.39 nm with the surface roughness of 96.16 nm. The effects of annealing atmosphere on the structure and morphology of copper oxide thin films are reported.

Original languageEnglish
Title of host publicationKey Engineering Materials
Pages113-117
Number of pages5
Volume594-595
DOIs
Publication statusPublished - 2014
Event2013 International Conference on Advanced Materials Engineering and Technology, ICAMET 2013 - Bandung
Duration: 28 Nov 201329 Nov 2013

Publication series

NameKey Engineering Materials
Volume594-595
ISSN (Print)10139826

Other

Other2013 International Conference on Advanced Materials Engineering and Technology, ICAMET 2013
CityBandung
Period28/11/1329/11/13

Fingerprint

Copper oxides
Sol-gel process
Oxide films
Spin coating
Annealing
Thin films
Substrates
Surface roughness
Air
Temperature
Diffraction patterns
Sol-gels
Atomic force microscopy
Crystalline materials
X ray diffraction
Scanning electron microscopy
Chemical analysis

Keywords

  • Annealing
  • Copper oxide
  • Sol-gel
  • Substrates
  • Thin films
  • Tio

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Halin, D. S. C., Talib, I. A., Daud, A. R., & Abdul Hamid, M. A. (2014). Effect of annealing atmosphere on the morphology of copper oxide thin films deposited on Tio2 substrates prepared by sol-gel process. In Key Engineering Materials (Vol. 594-595, pp. 113-117). (Key Engineering Materials; Vol. 594-595). https://doi.org/10.4028/www.scientific.net/KEM.594-595.113

Effect of annealing atmosphere on the morphology of copper oxide thin films deposited on Tio2 substrates prepared by sol-gel process. / Halin, D. S C; Talib, I. A.; Daud, A. R.; Abdul Hamid, Muhammad Azmi.

Key Engineering Materials. Vol. 594-595 2014. p. 113-117 (Key Engineering Materials; Vol. 594-595).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Halin, DSC, Talib, IA, Daud, AR & Abdul Hamid, MA 2014, Effect of annealing atmosphere on the morphology of copper oxide thin films deposited on Tio2 substrates prepared by sol-gel process. in Key Engineering Materials. vol. 594-595, Key Engineering Materials, vol. 594-595, pp. 113-117, 2013 International Conference on Advanced Materials Engineering and Technology, ICAMET 2013, Bandung, 28/11/13. https://doi.org/10.4028/www.scientific.net/KEM.594-595.113
Halin, D. S C ; Talib, I. A. ; Daud, A. R. ; Abdul Hamid, Muhammad Azmi. / Effect of annealing atmosphere on the morphology of copper oxide thin films deposited on Tio2 substrates prepared by sol-gel process. Key Engineering Materials. Vol. 594-595 2014. pp. 113-117 (Key Engineering Materials).
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