Development of an LFSR based test pattern generator for functional logic testing

Syed Zahidul Islam, Mohd Liakot Ali, Mohd Alauddin MohdAli

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    This paper presents the development of an LFSR based test pattern generator (TPG) to test the functional logic of combinational and sequential circuits. Primitive polynomial based LFSRs and deterministic testing algorithms are applied simultaneously on the circuit under test (CUT) to detect the fault with minimum test length. Fault simulation was performed on ISCAS'X5 and ISCAS'X9 benchmark circuits using digital fault simulation FSIM and Tetramax. The proposed technique achieved complete fault coverage with shorter test sequences and required less hardware for it s implementation.

    Original languageEnglish
    Title of host publicationProceedings of the IEEE International Conference on Electronics, Circuits, and Systems
    Pages591-594
    Number of pages4
    Volume2
    DOIs
    Publication statusPublished - 2003
    Event2003 10th IEEE International Conference on Electronics, Circuits and Systems, ICECS2003 - Sharjah
    Duration: 14 Dec 200317 Dec 2003

    Other

    Other2003 10th IEEE International Conference on Electronics, Circuits and Systems, ICECS2003
    CitySharjah
    Period14/12/0317/12/03

    Fingerprint

    Sequential circuits
    Combinatorial circuits
    Digital circuits
    Polynomials
    Hardware
    Networks (circuits)
    Testing

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Cite this

    Islam, S. Z., Ali, M. L., & MohdAli, M. A. (2003). Development of an LFSR based test pattern generator for functional logic testing. In Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems (Vol. 2, pp. 591-594). [301854] https://doi.org/10.1109/ICECS.2003.1301854

    Development of an LFSR based test pattern generator for functional logic testing. / Islam, Syed Zahidul; Ali, Mohd Liakot; MohdAli, Mohd Alauddin.

    Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems. Vol. 2 2003. p. 591-594 301854.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Islam, SZ, Ali, ML & MohdAli, MA 2003, Development of an LFSR based test pattern generator for functional logic testing. in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems. vol. 2, 301854, pp. 591-594, 2003 10th IEEE International Conference on Electronics, Circuits and Systems, ICECS2003, Sharjah, 14/12/03. https://doi.org/10.1109/ICECS.2003.1301854
    Islam SZ, Ali ML, MohdAli MA. Development of an LFSR based test pattern generator for functional logic testing. In Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems. Vol. 2. 2003. p. 591-594. 301854 https://doi.org/10.1109/ICECS.2003.1301854
    Islam, Syed Zahidul ; Ali, Mohd Liakot ; MohdAli, Mohd Alauddin. / Development of an LFSR based test pattern generator for functional logic testing. Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems. Vol. 2 2003. pp. 591-594
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