Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe

Nicholas Alderman, Mohd. Adib Ibrahim, Lefteris Danos, Martin C. Grossel, Tom Markvart

Research output: Contribution to journalArticle

Abstract

We report the determination of the surface recombination velocity of electron-hole pairs for silicon samples passivated with organic monolayers using the Kelvin probe. The recombination velocity was determined from the surface photovoltage and incident photon flux. By scanning of the Kelvin probe tip over the sample, the change in surface recombination velocity can be measured allowing recombination lifetime mapping. Organic monolayers with different chain lengths and exhibiting various recombination lifetimes were synthesized through a two-step chlorination-alkylation technique. The estimated recombination lifetimes were compared against those obtained from an industrial standard technique and were found to be in good agreement.

Original languageEnglish
Article number081603
JournalApplied Physics Letters
Volume103
Issue number8
DOIs
Publication statusPublished - 19 Aug 2013
Externally publishedYes

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life (durability)
probes
silicon
chlorination
alkylation
photovoltages
scanning
photons

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe. / Alderman, Nicholas; Ibrahim, Mohd. Adib; Danos, Lefteris; Grossel, Martin C.; Markvart, Tom.

In: Applied Physics Letters, Vol. 103, No. 8, 081603, 19.08.2013.

Research output: Contribution to journalArticle

Alderman, Nicholas ; Ibrahim, Mohd. Adib ; Danos, Lefteris ; Grossel, Martin C. ; Markvart, Tom. / Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe. In: Applied Physics Letters. 2013 ; Vol. 103, No. 8.
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