Deposition and characterization of chromium doped tin oxide transparent conducting thin films prepared by spray pyrolysis technique

M. H. Abdi, Noor Baa`Yah Ibrahim, M. M. Bagheree-Mohagheghee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Emergenceof innovative technological deposition technique of spray pyrolysis enabled the enhancement of structural, optical, and electrical properties of Sn1-xCrxO2 (x=0.0, 0.02, 0.04, 0.06, 0.10, 0.15) transparent semiconductors thin films in the present study. To evaluate these properties, X-Ray diffraction (XRD) spectroscopy were usedto study the elemental component and the crystalline nature of the materials while the optical properties and structure of the samples were evaluated using UV-vis spectroscopy and field emission scanning electron microscopy (FESEM). Finding showed that the Cr-doped SnO2 films were tetragonal in shape. Transmission spectra of the deposited films showed high transparency of ~ 70-90% in visible region with optical edge of 3.7eVfor SnO2. Resistivity of pure tin oxide samples was 0.01 Ω-Cm and increases with increase in dopant level. The Hall voltage showed that the type of semiconductor changed with increasing of dopant.

Original languageEnglish
Title of host publicationApplied Mechanics and Materials
Pages164-168
Number of pages5
Volume313-314
DOIs
Publication statusPublished - 2013
Event2012 2nd International Conference on Machinery Electronics and Control Engineering, ICMECE 2012 - Jinan, Shandong
Duration: 29 Dec 201230 Dec 2012

Publication series

NameApplied Mechanics and Materials
Volume313-314
ISSN (Print)16609336
ISSN (Electronic)16627482

Other

Other2012 2nd International Conference on Machinery Electronics and Control Engineering, ICMECE 2012
CityJinan, Shandong
Period29/12/1230/12/12

Fingerprint

Spray pyrolysis
Tin oxides
Chromium
Optical properties
Doping (additives)
Semiconductor materials
Thin films
Ultraviolet spectroscopy
Field emission
Transparency
Structural properties
Electric properties
Spectroscopy
Crystalline materials
X ray diffraction
Scanning electron microscopy
Electric potential

Keywords

  • Cr-doped sno
  • Energy gap
  • Spray pyrolysis

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Abdi, M. H., Ibrahim, N. BY., & Bagheree-Mohagheghee, M. M. (2013). Deposition and characterization of chromium doped tin oxide transparent conducting thin films prepared by spray pyrolysis technique. In Applied Mechanics and Materials (Vol. 313-314, pp. 164-168). (Applied Mechanics and Materials; Vol. 313-314). https://doi.org/10.4028/www.scientific.net/AMM.313-314.164

Deposition and characterization of chromium doped tin oxide transparent conducting thin films prepared by spray pyrolysis technique. / Abdi, M. H.; Ibrahim, Noor Baa`Yah; Bagheree-Mohagheghee, M. M.

Applied Mechanics and Materials. Vol. 313-314 2013. p. 164-168 (Applied Mechanics and Materials; Vol. 313-314).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abdi, MH, Ibrahim, NBY & Bagheree-Mohagheghee, MM 2013, Deposition and characterization of chromium doped tin oxide transparent conducting thin films prepared by spray pyrolysis technique. in Applied Mechanics and Materials. vol. 313-314, Applied Mechanics and Materials, vol. 313-314, pp. 164-168, 2012 2nd International Conference on Machinery Electronics and Control Engineering, ICMECE 2012, Jinan, Shandong, 29/12/12. https://doi.org/10.4028/www.scientific.net/AMM.313-314.164
Abdi MH, Ibrahim NBY, Bagheree-Mohagheghee MM. Deposition and characterization of chromium doped tin oxide transparent conducting thin films prepared by spray pyrolysis technique. In Applied Mechanics and Materials. Vol. 313-314. 2013. p. 164-168. (Applied Mechanics and Materials). https://doi.org/10.4028/www.scientific.net/AMM.313-314.164
Abdi, M. H. ; Ibrahim, Noor Baa`Yah ; Bagheree-Mohagheghee, M. M. / Deposition and characterization of chromium doped tin oxide transparent conducting thin films prepared by spray pyrolysis technique. Applied Mechanics and Materials. Vol. 313-314 2013. pp. 164-168 (Applied Mechanics and Materials).
@inproceedings{8f2d9b8f0fd04ca7a278561bb354d1e5,
title = "Deposition and characterization of chromium doped tin oxide transparent conducting thin films prepared by spray pyrolysis technique",
abstract = "Emergenceof innovative technological deposition technique of spray pyrolysis enabled the enhancement of structural, optical, and electrical properties of Sn1-xCrxO2 (x=0.0, 0.02, 0.04, 0.06, 0.10, 0.15) transparent semiconductors thin films in the present study. To evaluate these properties, X-Ray diffraction (XRD) spectroscopy were usedto study the elemental component and the crystalline nature of the materials while the optical properties and structure of the samples were evaluated using UV-vis spectroscopy and field emission scanning electron microscopy (FESEM). Finding showed that the Cr-doped SnO2 films were tetragonal in shape. Transmission spectra of the deposited films showed high transparency of ~ 70-90{\%} in visible region with optical edge of 3.7eVfor SnO2. Resistivity of pure tin oxide samples was 0.01 Ω-Cm and increases with increase in dopant level. The Hall voltage showed that the type of semiconductor changed with increasing of dopant.",
keywords = "Cr-doped sno, Energy gap, Spray pyrolysis",
author = "Abdi, {M. H.} and Ibrahim, {Noor Baa`Yah} and Bagheree-Mohagheghee, {M. M.}",
year = "2013",
doi = "10.4028/www.scientific.net/AMM.313-314.164",
language = "English",
isbn = "9783037856840",
volume = "313-314",
series = "Applied Mechanics and Materials",
pages = "164--168",
booktitle = "Applied Mechanics and Materials",

}

TY - GEN

T1 - Deposition and characterization of chromium doped tin oxide transparent conducting thin films prepared by spray pyrolysis technique

AU - Abdi, M. H.

AU - Ibrahim, Noor Baa`Yah

AU - Bagheree-Mohagheghee, M. M.

PY - 2013

Y1 - 2013

N2 - Emergenceof innovative technological deposition technique of spray pyrolysis enabled the enhancement of structural, optical, and electrical properties of Sn1-xCrxO2 (x=0.0, 0.02, 0.04, 0.06, 0.10, 0.15) transparent semiconductors thin films in the present study. To evaluate these properties, X-Ray diffraction (XRD) spectroscopy were usedto study the elemental component and the crystalline nature of the materials while the optical properties and structure of the samples were evaluated using UV-vis spectroscopy and field emission scanning electron microscopy (FESEM). Finding showed that the Cr-doped SnO2 films were tetragonal in shape. Transmission spectra of the deposited films showed high transparency of ~ 70-90% in visible region with optical edge of 3.7eVfor SnO2. Resistivity of pure tin oxide samples was 0.01 Ω-Cm and increases with increase in dopant level. The Hall voltage showed that the type of semiconductor changed with increasing of dopant.

AB - Emergenceof innovative technological deposition technique of spray pyrolysis enabled the enhancement of structural, optical, and electrical properties of Sn1-xCrxO2 (x=0.0, 0.02, 0.04, 0.06, 0.10, 0.15) transparent semiconductors thin films in the present study. To evaluate these properties, X-Ray diffraction (XRD) spectroscopy were usedto study the elemental component and the crystalline nature of the materials while the optical properties and structure of the samples were evaluated using UV-vis spectroscopy and field emission scanning electron microscopy (FESEM). Finding showed that the Cr-doped SnO2 films were tetragonal in shape. Transmission spectra of the deposited films showed high transparency of ~ 70-90% in visible region with optical edge of 3.7eVfor SnO2. Resistivity of pure tin oxide samples was 0.01 Ω-Cm and increases with increase in dopant level. The Hall voltage showed that the type of semiconductor changed with increasing of dopant.

KW - Cr-doped sno

KW - Energy gap

KW - Spray pyrolysis

UR - http://www.scopus.com/inward/record.url?scp=84876524645&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84876524645&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/AMM.313-314.164

DO - 10.4028/www.scientific.net/AMM.313-314.164

M3 - Conference contribution

AN - SCOPUS:84876524645

SN - 9783037856840

VL - 313-314

T3 - Applied Mechanics and Materials

SP - 164

EP - 168

BT - Applied Mechanics and Materials

ER -