Comparative study of ZnS thin films grown by chemical bath deposition and magnetron sputtering

M. A. Islam, M. S. Hossain, M. M. Aliyu, Y. Sulaiman, M. R. Karim, Kamaruzzaman Sopian, Nowshad Amin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Citations (Scopus)

Abstract

Zinc sulphide thin films have been deposited on FTO coated glass substrates using the sputtering and chemical bath deposition techniques. ZnS thin film is at first grown by CBD using a aqueous solution of thioria, ammonia, ammonium chloride and zinc chloride, respectively; whereas ZnS thin film is also grown from sputtering technique at a substrate temperature 300 °C. The grown films from the both processes were annealed in a vacuum furnace of nitrogen ambient with pressure 250-300 mTorr. A comparative study of structural and optical study of these films was carried out by means of XRD, AFM and UV-Vis spectrometry. It has been found that the films in both processes are polycrystalline in nature having the (200) preferential orientation. The crystallite grain size, lattice constant, microstrain and dislocation densities of the films are quite different in both processes as observed from XRD analysis. Surface structure and topography were observed from the AFM images. The higher r.m.s values of surface roughness as well as bigger grains are observed in CBD grown ZnS thin films. The band gap has been found 3.58 and 3.54eV for the films prepared from CBD and sputtering, respectively.

Original languageEnglish
Title of host publication2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012
Pages86-89
Number of pages4
DOIs
Publication statusPublished - 2012
Event2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012 - Dhaka
Duration: 20 Dec 201222 Dec 2012

Other

Other2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012
CityDhaka
Period20/12/1222/12/12

Fingerprint

Magnetron sputtering
Thin films
Sputtering
Vacuum furnaces
Zinc chloride
Zinc sulfide
Surface topography
Substrates
Surface structure
Spectrometry
Lattice constants
Ammonia
Energy gap
Surface roughness
Nitrogen
Glass
Temperature

Keywords

  • CBD
  • Sputtering
  • ZnS thin films

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Islam, M. A., Hossain, M. S., Aliyu, M. M., Sulaiman, Y., Karim, M. R., Sopian, K., & Amin, N. (2012). Comparative study of ZnS thin films grown by chemical bath deposition and magnetron sputtering. In 2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012 (pp. 86-89). [6471491] https://doi.org/10.1109/ICECE.2012.6471491

Comparative study of ZnS thin films grown by chemical bath deposition and magnetron sputtering. / Islam, M. A.; Hossain, M. S.; Aliyu, M. M.; Sulaiman, Y.; Karim, M. R.; Sopian, Kamaruzzaman; Amin, Nowshad.

2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012. 2012. p. 86-89 6471491.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Islam, MA, Hossain, MS, Aliyu, MM, Sulaiman, Y, Karim, MR, Sopian, K & Amin, N 2012, Comparative study of ZnS thin films grown by chemical bath deposition and magnetron sputtering. in 2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012., 6471491, pp. 86-89, 2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012, Dhaka, 20/12/12. https://doi.org/10.1109/ICECE.2012.6471491
Islam MA, Hossain MS, Aliyu MM, Sulaiman Y, Karim MR, Sopian K et al. Comparative study of ZnS thin films grown by chemical bath deposition and magnetron sputtering. In 2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012. 2012. p. 86-89. 6471491 https://doi.org/10.1109/ICECE.2012.6471491
Islam, M. A. ; Hossain, M. S. ; Aliyu, M. M. ; Sulaiman, Y. ; Karim, M. R. ; Sopian, Kamaruzzaman ; Amin, Nowshad. / Comparative study of ZnS thin films grown by chemical bath deposition and magnetron sputtering. 2012 7th International Conference on Electrical and Computer Engineering, ICECE 2012. 2012. pp. 86-89
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