Cold deposition of zinc sulfide optical waveguides using thermoelectric device

Saafie Salleh, H. N. Rutt, M. N. Dalimin, Muhamad Mat Salleh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Zinc sulfide (ZnS) thin films as the waveguide medium have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = -50°C) and ambient temperature (Tambient = 25°C) by thermal evaporation technique. The surface morphology of ZnS films were pictured with an atomic force microscopy (AFM) and the surface roughness were calculated from the AFM images. The propagation losses of the samples were measured using a scanning detection technique attached to a prism coupler. The AFM results revealed that the surface of cold deposited ZnS film is rougher than the surface of ambient deposited ZnS film. The propagation losses of the cold deposited ZnS waveguide are consistently lower than the ambient deposited ZnS waveguide at all measured wavelengths.

Original languageEnglish
Title of host publicationAdvanced Materials Research
Pages856-861
Number of pages6
Volume264-265
DOIs
Publication statusPublished - 2011
EventInternational Conference on Advances in Materials and Processing Technologies, AMPT 2009 -
Duration: 26 Oct 200929 Oct 2009

Publication series

NameAdvanced Materials Research
Volume264-265
ISSN (Print)10226680

Other

OtherInternational Conference on Advances in Materials and Processing Technologies, AMPT 2009
Period26/10/0929/10/09

Fingerprint

Zinc sulfide
Optical waveguides
Atomic force microscopy
Waveguides
Thermal evaporation
Prisms
Silicon wafers
Surface morphology
Surface roughness
Scanning
Thin films
Wavelength
Temperature
Substrates

Keywords

  • Cold deposition
  • Propagation loss
  • Surface roughness
  • ZnS waveguide

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Salleh, S., Rutt, H. N., Dalimin, M. N., & Mat Salleh, M. (2011). Cold deposition of zinc sulfide optical waveguides using thermoelectric device. In Advanced Materials Research (Vol. 264-265, pp. 856-861). (Advanced Materials Research; Vol. 264-265). https://doi.org/10.4028/www.scientific.net/AMR.264-265.856

Cold deposition of zinc sulfide optical waveguides using thermoelectric device. / Salleh, Saafie; Rutt, H. N.; Dalimin, M. N.; Mat Salleh, Muhamad.

Advanced Materials Research. Vol. 264-265 2011. p. 856-861 (Advanced Materials Research; Vol. 264-265).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Salleh, S, Rutt, HN, Dalimin, MN & Mat Salleh, M 2011, Cold deposition of zinc sulfide optical waveguides using thermoelectric device. in Advanced Materials Research. vol. 264-265, Advanced Materials Research, vol. 264-265, pp. 856-861, International Conference on Advances in Materials and Processing Technologies, AMPT 2009, 26/10/09. https://doi.org/10.4028/www.scientific.net/AMR.264-265.856
Salleh S, Rutt HN, Dalimin MN, Mat Salleh M. Cold deposition of zinc sulfide optical waveguides using thermoelectric device. In Advanced Materials Research. Vol. 264-265. 2011. p. 856-861. (Advanced Materials Research). https://doi.org/10.4028/www.scientific.net/AMR.264-265.856
Salleh, Saafie ; Rutt, H. N. ; Dalimin, M. N. ; Mat Salleh, Muhamad. / Cold deposition of zinc sulfide optical waveguides using thermoelectric device. Advanced Materials Research. Vol. 264-265 2011. pp. 856-861 (Advanced Materials Research).
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