Characterization of Si nanostructured surfaces

Saleem H. Zaidi, James M. Gee, Douglas S. Ruby, S. R J Brueck

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Surface texturing of Si to enhance absorption particularly in the IR spectral region has been extensively investigated. Previous research chiefly examined approaches based on geometrical optics. These surface textures typically consist of pyramids with dimensions much larger than optical wavelengths. We have investigated a physical optics approach that relies on surface texture features comparable to, or smaller than, the optical wavelengths inside the semiconductor material. Light interaction at this are strongly dependent on incident polarization and surface profile. Nanoscale textures can be tuned for either narrow band, or broad band absorptive behavior. Lowest broad band reflection has been observed for triangular profiles with linewidths significantly less than 100 nm. Si nanostructures have been integrated into large (approx. 42 cm 2) area solar cells. Internal quantum efficiency measurements in comparison with polished and conventionally textured cells show lower efficiency in the UV-visible (350-680 nm), but significantly higher IR (700-1200 nm) efficiency.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages151-159
Number of pages9
Volume3790
Publication statusPublished - 1999
Externally publishedYes
EventProceedings of the 1999 Engineered Nanostructural Films and Materials - Denver, CO, USA
Duration: 22 Jul 199923 Jul 1999

Other

OtherProceedings of the 1999 Engineered Nanostructural Films and Materials
CityDenver, CO, USA
Period22/7/9923/7/99

Fingerprint

textures
Textures
broadband
Physical optics
Geometrical optics
physical optics
Wavelength
Texturing
geometrical optics
Beam plasma interactions
profiles
pyramids
Quantum efficiency
wavelengths
Linewidth
narrowband
quantum efficiency
Nanostructures
Solar cells
solar cells

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Zaidi, S. H., Gee, J. M., Ruby, D. S., & Brueck, S. R. J. (1999). Characterization of Si nanostructured surfaces. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3790, pp. 151-159). Society of Photo-Optical Instrumentation Engineers.

Characterization of Si nanostructured surfaces. / Zaidi, Saleem H.; Gee, James M.; Ruby, Douglas S.; Brueck, S. R J.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3790 Society of Photo-Optical Instrumentation Engineers, 1999. p. 151-159.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zaidi, SH, Gee, JM, Ruby, DS & Brueck, SRJ 1999, Characterization of Si nanostructured surfaces. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3790, Society of Photo-Optical Instrumentation Engineers, pp. 151-159, Proceedings of the 1999 Engineered Nanostructural Films and Materials, Denver, CO, USA, 22/7/99.
Zaidi SH, Gee JM, Ruby DS, Brueck SRJ. Characterization of Si nanostructured surfaces. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3790. Society of Photo-Optical Instrumentation Engineers. 1999. p. 151-159
Zaidi, Saleem H. ; Gee, James M. ; Ruby, Douglas S. ; Brueck, S. R J. / Characterization of Si nanostructured surfaces. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3790 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 151-159
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