Characterisation of the properties of surface-treated indium-tin oxide thin films

J. S. Kim, F. Cacialli, M. Granström, R. H. Friend, N. Johansson, W. R. Salaneck, Rusli Daik, W. J. Feast

Research output: Contribution to journalArticle

60 Citations (Scopus)

Abstract

We studied the surface properties of indium-tin oxide (ITO) modified by wet (aquaregia, ultrasonication, RCA) and dry (oxygen and argon plasmas) treatments. The influence of surface treatment on ITO was investigated by surface energy, surface roughness, sheet resistance, and workfunction measurements. We report that oxygen plasma treatment induces: (1) the highest surface energy with the highest polarity, (2) the smoothest surface, (3) the lowest sheet resistance, and (4) the highest workfunction. We also observe that the PL efficiencies of PPV, PDPV and PEDOT/PPV on ITO are affected by the surface treatment of ITO.

Original languageEnglish
Pages (from-to)111-112
Number of pages2
JournalSynthetic Metals
Volume101
Issue number1
DOIs
Publication statusPublished - May 1999
Externally publishedYes

Fingerprint

Tin oxides
indium oxides
Indium
tin oxides
Oxide films
Thin films
Sheet resistance
oxygen plasma
thin films
surface treatment
Interfacial energy
surface energy
Surface treatment
Oxygen
Plasmas
Argon
argon plasma
surface properties
Surface properties
polarity

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Polymers and Plastics

Cite this

Kim, J. S., Cacialli, F., Granström, M., Friend, R. H., Johansson, N., Salaneck, W. R., ... Feast, W. J. (1999). Characterisation of the properties of surface-treated indium-tin oxide thin films. Synthetic Metals, 101(1), 111-112. https://doi.org/10.1016/S0379-6779(98)01127-8

Characterisation of the properties of surface-treated indium-tin oxide thin films. / Kim, J. S.; Cacialli, F.; Granström, M.; Friend, R. H.; Johansson, N.; Salaneck, W. R.; Daik, Rusli; Feast, W. J.

In: Synthetic Metals, Vol. 101, No. 1, 05.1999, p. 111-112.

Research output: Contribution to journalArticle

Kim, JS, Cacialli, F, Granström, M, Friend, RH, Johansson, N, Salaneck, WR, Daik, R & Feast, WJ 1999, 'Characterisation of the properties of surface-treated indium-tin oxide thin films', Synthetic Metals, vol. 101, no. 1, pp. 111-112. https://doi.org/10.1016/S0379-6779(98)01127-8
Kim JS, Cacialli F, Granström M, Friend RH, Johansson N, Salaneck WR et al. Characterisation of the properties of surface-treated indium-tin oxide thin films. Synthetic Metals. 1999 May;101(1):111-112. https://doi.org/10.1016/S0379-6779(98)01127-8
Kim, J. S. ; Cacialli, F. ; Granström, M. ; Friend, R. H. ; Johansson, N. ; Salaneck, W. R. ; Daik, Rusli ; Feast, W. J. / Characterisation of the properties of surface-treated indium-tin oxide thin films. In: Synthetic Metals. 1999 ; Vol. 101, No. 1. pp. 111-112.
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