Challenges of time domain measurement of field-field correlation for complex PCBs

C. Smartt, D. W P Thomas, H. Nasser, Mohd Hafiz Baharuddin, G. Gradoni, S. C. Creagh, G. Tanner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

21 Citations (Scopus)

Abstract

Measurements of field-field correlation in the time domain can be used to characterize stochastic broadband emissions from complex sources. A two-probe scanning measurement system is developed and used to sample the stochastic emissions in the near-field of two such sources: a reverberation chamber with a rectangular aperture and a generic printed circuit board (PCB). We show that measured field data can be utilized in numerical wave propagation schemes to predict the stochastic fields in and radiated from a packaged device.

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages953-958
Number of pages6
Volume2015-Septmber
ISBN (Electronic)9781479966158
DOIs
Publication statusPublished - 10 Sep 2015
Externally publishedYes
EventIEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Germany
Duration: 16 Aug 201522 Aug 2015

Other

OtherIEEE International Symposium on Electromagnetic Compatibility, EMC 2015
CountryGermany
CityDresden
Period16/8/1522/8/15

Fingerprint

polychlorinated biphenyls
Polychlorinated biphenyls
reverberation chambers
Reverberation
printed circuits
circuit boards
Printed circuit boards
Wave propagation
wave propagation
near fields
apertures
broadband
Scanning
scanning
probes

Keywords

  • field correlation function
  • near field scanning
  • printed circuit boards
  • time domain measurement

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Smartt, C., Thomas, D. W. P., Nasser, H., Baharuddin, M. H., Gradoni, G., Creagh, S. C., & Tanner, G. (2015). Challenges of time domain measurement of field-field correlation for complex PCBs. In 2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015 (Vol. 2015-Septmber, pp. 953-958). [7256294] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.2015.7256294

Challenges of time domain measurement of field-field correlation for complex PCBs. / Smartt, C.; Thomas, D. W P; Nasser, H.; Baharuddin, Mohd Hafiz; Gradoni, G.; Creagh, S. C.; Tanner, G.

2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015. Vol. 2015-Septmber Institute of Electrical and Electronics Engineers Inc., 2015. p. 953-958 7256294.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Smartt, C, Thomas, DWP, Nasser, H, Baharuddin, MH, Gradoni, G, Creagh, SC & Tanner, G 2015, Challenges of time domain measurement of field-field correlation for complex PCBs. in 2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015. vol. 2015-Septmber, 7256294, Institute of Electrical and Electronics Engineers Inc., pp. 953-958, IEEE International Symposium on Electromagnetic Compatibility, EMC 2015, Dresden, Germany, 16/8/15. https://doi.org/10.1109/ISEMC.2015.7256294
Smartt C, Thomas DWP, Nasser H, Baharuddin MH, Gradoni G, Creagh SC et al. Challenges of time domain measurement of field-field correlation for complex PCBs. In 2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015. Vol. 2015-Septmber. Institute of Electrical and Electronics Engineers Inc. 2015. p. 953-958. 7256294 https://doi.org/10.1109/ISEMC.2015.7256294
Smartt, C. ; Thomas, D. W P ; Nasser, H. ; Baharuddin, Mohd Hafiz ; Gradoni, G. ; Creagh, S. C. ; Tanner, G. / Challenges of time domain measurement of field-field correlation for complex PCBs. 2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015. Vol. 2015-Septmber Institute of Electrical and Electronics Engineers Inc., 2015. pp. 953-958
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