Challenges and directions for testing IC

Liakot Ali, Roslina Sidek, Ishak Aris, Bambang Sunaryo Suparjo, Mohd Alauddin Mohd Ali

    Research output: Contribution to journalArticle

    13 Citations (Scopus)

    Abstract

    In today's semiconductor world, integration technology is improving and refining dramatically. With the continuous increase of integration densities and complexities, the problem of integrated circuit (IC) testing has become much more acute. IC testing is now no more a back-end issue, rather it has become a front-end burning issue, which needs an economic solution with reliable performance. Otherwise all the benefits of semiconductor technology would be meaningless. A roadmap of semiconductor technology in the context of IC testing is shown in this paper. Researchers and manufacturers can get to know current challenges and directions of IC testing through this discussion.

    Original languageEnglish
    Pages (from-to)17-28
    Number of pages12
    JournalIntegration, the VLSI Journal
    Volume37
    Issue number1
    DOIs
    Publication statusPublished - Feb 2004

    Fingerprint

    Integrated circuit testing
    Semiconductor materials
    Refining
    Economics

    Keywords

    • ATE
    • BIST
    • DFT
    • IC
    • SIA

    ASJC Scopus subject areas

    • Hardware and Architecture
    • Software
    • Electrical and Electronic Engineering

    Cite this

    Ali, L., Sidek, R., Aris, I., Suparjo, B. S., & Ali, M. A. M. (2004). Challenges and directions for testing IC. Integration, the VLSI Journal, 37(1), 17-28. https://doi.org/10.1016/j.vlsi.2003.09.006

    Challenges and directions for testing IC. / Ali, Liakot; Sidek, Roslina; Aris, Ishak; Suparjo, Bambang Sunaryo; Ali, Mohd Alauddin Mohd.

    In: Integration, the VLSI Journal, Vol. 37, No. 1, 02.2004, p. 17-28.

    Research output: Contribution to journalArticle

    Ali, L, Sidek, R, Aris, I, Suparjo, BS & Ali, MAM 2004, 'Challenges and directions for testing IC', Integration, the VLSI Journal, vol. 37, no. 1, pp. 17-28. https://doi.org/10.1016/j.vlsi.2003.09.006
    Ali, Liakot ; Sidek, Roslina ; Aris, Ishak ; Suparjo, Bambang Sunaryo ; Ali, Mohd Alauddin Mohd. / Challenges and directions for testing IC. In: Integration, the VLSI Journal. 2004 ; Vol. 37, No. 1. pp. 17-28.
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