Application of a computer based system for statistical process control in a semiconductor company

A case study

Nor Kamaliana Khamis, Baba Md Deros, Nizaroyani Saibani, Syamsinar Baizura Ahmad Sabki

Research output: Contribution to journalArticle

Abstract

The use of Statistical Process Control (SPC) in the manufacturing process has been historically proven to increase the quality of the product. Recent trends show that companies are becoming increasingly reliant on computer based-SPC because it can save a significant amount of time compared with traditional SPC. In addition, labor-intensive tasks, such as manual data collection and entry, can be eliminated, thus reducing human error. This paper aims to prove the benefits of computer based system for SPC known as e-SPC in a semiconductor manufacturing environment. Specifically, this paper will present the case study's finding that show how one semiconductor manufacturing company's use of e-SPC can detect a process abnormality at an early stage and in real time compared with manual SPC. The case study involves interviews with the company representatives and observations on the manufacturing environment. This paper will also show how e-SPC can be used to control and then to stabilize the manufacturing operation. In conclusion, this paper demonstrates that e-SPC can significantly improve the performance of a manufacturing environment. Moreover, this paper can also be used as a reference for the implementation of e-SPC in any company.

Original languageEnglish
Pages (from-to)99-105
Number of pages7
JournalJurnal Teknologi (Sciences and Engineering)
Volume59
Issue numberSUPPL.2
Publication statusPublished - 2012

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Statistical process control
Semiconductor materials
Industry
Personnel

Keywords

  • Control limit
  • Quality
  • Semiconductor company
  • Statistical process control

ASJC Scopus subject areas

  • Engineering(all)

Cite this

@article{077ade1e6403472e9c46c4050cb3024f,
title = "Application of a computer based system for statistical process control in a semiconductor company: A case study",
abstract = "The use of Statistical Process Control (SPC) in the manufacturing process has been historically proven to increase the quality of the product. Recent trends show that companies are becoming increasingly reliant on computer based-SPC because it can save a significant amount of time compared with traditional SPC. In addition, labor-intensive tasks, such as manual data collection and entry, can be eliminated, thus reducing human error. This paper aims to prove the benefits of computer based system for SPC known as e-SPC in a semiconductor manufacturing environment. Specifically, this paper will present the case study's finding that show how one semiconductor manufacturing company's use of e-SPC can detect a process abnormality at an early stage and in real time compared with manual SPC. The case study involves interviews with the company representatives and observations on the manufacturing environment. This paper will also show how e-SPC can be used to control and then to stabilize the manufacturing operation. In conclusion, this paper demonstrates that e-SPC can significantly improve the performance of a manufacturing environment. Moreover, this paper can also be used as a reference for the implementation of e-SPC in any company.",
keywords = "Control limit, Quality, Semiconductor company, Statistical process control",
author = "Khamis, {Nor Kamaliana} and {Md Deros}, Baba and Nizaroyani Saibani and Sabki, {Syamsinar Baizura Ahmad}",
year = "2012",
language = "English",
volume = "59",
pages = "99--105",
journal = "Jurnal Teknologi",
issn = "0127-9696",
publisher = "Penerbit Universiti Teknologi Malaysia",
number = "SUPPL.2",

}

TY - JOUR

T1 - Application of a computer based system for statistical process control in a semiconductor company

T2 - A case study

AU - Khamis, Nor Kamaliana

AU - Md Deros, Baba

AU - Saibani, Nizaroyani

AU - Sabki, Syamsinar Baizura Ahmad

PY - 2012

Y1 - 2012

N2 - The use of Statistical Process Control (SPC) in the manufacturing process has been historically proven to increase the quality of the product. Recent trends show that companies are becoming increasingly reliant on computer based-SPC because it can save a significant amount of time compared with traditional SPC. In addition, labor-intensive tasks, such as manual data collection and entry, can be eliminated, thus reducing human error. This paper aims to prove the benefits of computer based system for SPC known as e-SPC in a semiconductor manufacturing environment. Specifically, this paper will present the case study's finding that show how one semiconductor manufacturing company's use of e-SPC can detect a process abnormality at an early stage and in real time compared with manual SPC. The case study involves interviews with the company representatives and observations on the manufacturing environment. This paper will also show how e-SPC can be used to control and then to stabilize the manufacturing operation. In conclusion, this paper demonstrates that e-SPC can significantly improve the performance of a manufacturing environment. Moreover, this paper can also be used as a reference for the implementation of e-SPC in any company.

AB - The use of Statistical Process Control (SPC) in the manufacturing process has been historically proven to increase the quality of the product. Recent trends show that companies are becoming increasingly reliant on computer based-SPC because it can save a significant amount of time compared with traditional SPC. In addition, labor-intensive tasks, such as manual data collection and entry, can be eliminated, thus reducing human error. This paper aims to prove the benefits of computer based system for SPC known as e-SPC in a semiconductor manufacturing environment. Specifically, this paper will present the case study's finding that show how one semiconductor manufacturing company's use of e-SPC can detect a process abnormality at an early stage and in real time compared with manual SPC. The case study involves interviews with the company representatives and observations on the manufacturing environment. This paper will also show how e-SPC can be used to control and then to stabilize the manufacturing operation. In conclusion, this paper demonstrates that e-SPC can significantly improve the performance of a manufacturing environment. Moreover, this paper can also be used as a reference for the implementation of e-SPC in any company.

KW - Control limit

KW - Quality

KW - Semiconductor company

KW - Statistical process control

UR - http://www.scopus.com/inward/record.url?scp=84872702525&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84872702525&partnerID=8YFLogxK

M3 - Article

VL - 59

SP - 99

EP - 105

JO - Jurnal Teknologi

JF - Jurnal Teknologi

SN - 0127-9696

IS - SUPPL.2

ER -