An investigation on structural and electrical properties of close-spaced sublimation grown CdTe thin films in different growth conditions

F. M.T. Enam, K. S. Rahman, M. I. Kamaruzzaman, K. Sobayel, M. Aktharuzzaman, Nowshad Amin

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

CdTe is considered as one of the most auspicious materials as absorber layer for fabricating thin film solar cells with highest efficiency of 22.1% at present reported by First Solar Inc. Growth conditions and parameters are crucial aspects to acquire high quality and pin hole free thin absorber layer. In this study, a comparative analysis has been executed for close-spaced sublimation (CSS) grown CdTe thin films in both dynamic and static conditions. These growth conditions may have dependence on the way of inert gas flow during deposition. Deposited films have been characterized by using XRD, FESEM, AFM and Hall Effect Measurement. The XRD pattern reveals the presence of zinc-blende cubic structure with ideal orientation (111) confirming polycrystalline nature. The FESEM characterization illustrates the films that are homogenous, uniform and have less crystal defects. AFM analysis has been carried out to know the surface topography and roughness which has the increasing trend for thicker films. Moreover, the electrical parameters such as carrier concentration, mobility, resistivity, and conductivity have been measured from Hall Effect measurement.

Original languageEnglish
Pages (from-to)125-131
Number of pages7
JournalChalcogenide Letters
Volume14
Issue number4
Publication statusPublished - 1 Apr 2017

Fingerprint

Sublimation
Hall effect
sublimation
Structural properties
Electric properties
electrical properties
Noble Gases
Thin films
Crystal defects
absorbers
Surface topography
thin films
Inert gases
Thick films
atomic force microscopy
Carrier concentration
Flow of gases
Zinc
Surface roughness
crystal defects

Keywords

  • AFM
  • CdTe thin film
  • Close spaced sublimation
  • Growth condition
  • XRD

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Physics and Astronomy(all)

Cite this

An investigation on structural and electrical properties of close-spaced sublimation grown CdTe thin films in different growth conditions. / Enam, F. M.T.; Rahman, K. S.; Kamaruzzaman, M. I.; Sobayel, K.; Aktharuzzaman, M.; Amin, Nowshad.

In: Chalcogenide Letters, Vol. 14, No. 4, 01.04.2017, p. 125-131.

Research output: Contribution to journalArticle

Enam, F. M.T. ; Rahman, K. S. ; Kamaruzzaman, M. I. ; Sobayel, K. ; Aktharuzzaman, M. ; Amin, Nowshad. / An investigation on structural and electrical properties of close-spaced sublimation grown CdTe thin films in different growth conditions. In: Chalcogenide Letters. 2017 ; Vol. 14, No. 4. pp. 125-131.
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